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Journal ArticleDOI

Lead-free Solders in Microelectronics

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TLDR
The most widely used Pb-free solders have the eutectic composition as mentioned in this paper, which has been identified as a major factor affecting alloy selection, since this will have a major impact on the other polymeric materials used in microelectronic assembly and encapsulation.
Abstract
Practically all microelectronic assemblies in use today utilize Pb–Sn solders for interconnection. With the advent of chip scale packaging technologies, the usage of solder connections has increased. The most widely used Pb–Sn solder has the eutectic composition. Emerging environmental regulations worldwide, most notably in Europe and Japan, have targeted the elimination of Pb usage in electronic assemblies, due to the inherent toxicity of Pb. This has made the search for suitable “Pb-free” solders an important issue for microelectronics assembly. Approximately 70 Pb-free solder alloy compositions have been proposed thus far. There is a general lack of engineering information, and there is also significant disparity in the information available on these alloys. The issues involved can be divided into two broad categories: manufacturing and reliability/performance. A major factor affecting alloy selection is the melting point of the alloy, since this will have a major impact on the other polymeric materials used in microelectronic assembly and encapsulation. Other important manufacturing issues are cost, availability, and wetting characteristics. Reliability related properties include mechanical strength, fatigue resistance, coefficient of thermal expansion and intermetallic compound formation. The data available in the open literature have been reviewed and are summarized in this paper. Where data were not available, such as for corrosion and oxidation resistance, chemical thermodynamics was used to develop this information. While a formal alloy selection decision analysis methodology has not been developed, less formal approaches indicate that Sn-rich alloys will be the Pb-free solder alloys of choice, with three to four alloys being identified for each of the different applications. Research on this topic continues at the present time at a vigorous pace, in view of the imminence of the issue.

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Citations
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Journal ArticleDOI

Emerging Materials Challenges in Microelectronics Packaging

D. R. Frear, +1 more
- 01 Jan 2003 - 
TL;DR: In this article, the authors highlight the key issues facing the packaging of high-performance digital and rf electronics, including increased speed, the number of input/output interconnects, decreased pitch, and decreased cost.
Journal ArticleDOI

Enhancement on the high-temperature joint reliability and corrosion resistance of Sn–0.3Ag–0.7Cu low-Ag solder contributed by Al2O3 Nanoparticles (0.12 wt%)

TL;DR: In this article, the evolution of interfacial microstructures and mechanical properties of the joints soldered with Sn-0.3Ag -0.7Cu and 0.12Al2O3 nanoparticles (NPs) aged at 150°C for different hours (72-840h).
Proceedings ArticleDOI

UbBM (under bump metallization) study for Pb-free electroplating bumping : interface reaction and electromigration

TL;DR: In this article, the effects of reflow time, high temperature aging, and current-stress on interface reactions between Under Bump Metallization (UBM) systems and electroplated bumps have been studied.
Journal ArticleDOI

Enhancing the Mechanical Response of a Lead-Free Solder Using an Energy-Efficient Microwave Sintering Route

TL;DR: In this article, the effects of conventional and microwave sintering on the densification, microstructure, and tensile properties of a lead-free solder, Sn-3.5Ag.
Journal ArticleDOI

Effects of AlN Nanoparticles on the Microstructure, Solderability, and Mechanical Properties of Sn-Ag-Cu Solder

TL;DR: In this article, the influence of AlN nanosized particles on the microstructure, mechanical properties, and solderability (e.g., spreadability and wettability) have been carried out.
References
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Journal ArticleDOI

Quantitative assessment of worldwide contamination of air, water and soils by trace metals

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Journal ArticleDOI

Interdiffusion and Reaction in Bimetallic Cu-Sn Thin Films

TL;DR: In this article, a Seemann-Bohlin diffractometer was used to investigate interdiffusion and intermetallic compound formation in Cu-Sn thin film couples.
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