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Journal ArticleDOI

Lead-free Solders in Microelectronics

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TLDR
The most widely used Pb-free solders have the eutectic composition as mentioned in this paper, which has been identified as a major factor affecting alloy selection, since this will have a major impact on the other polymeric materials used in microelectronic assembly and encapsulation.
Abstract
Practically all microelectronic assemblies in use today utilize Pb–Sn solders for interconnection. With the advent of chip scale packaging technologies, the usage of solder connections has increased. The most widely used Pb–Sn solder has the eutectic composition. Emerging environmental regulations worldwide, most notably in Europe and Japan, have targeted the elimination of Pb usage in electronic assemblies, due to the inherent toxicity of Pb. This has made the search for suitable “Pb-free” solders an important issue for microelectronics assembly. Approximately 70 Pb-free solder alloy compositions have been proposed thus far. There is a general lack of engineering information, and there is also significant disparity in the information available on these alloys. The issues involved can be divided into two broad categories: manufacturing and reliability/performance. A major factor affecting alloy selection is the melting point of the alloy, since this will have a major impact on the other polymeric materials used in microelectronic assembly and encapsulation. Other important manufacturing issues are cost, availability, and wetting characteristics. Reliability related properties include mechanical strength, fatigue resistance, coefficient of thermal expansion and intermetallic compound formation. The data available in the open literature have been reviewed and are summarized in this paper. Where data were not available, such as for corrosion and oxidation resistance, chemical thermodynamics was used to develop this information. While a formal alloy selection decision analysis methodology has not been developed, less formal approaches indicate that Sn-rich alloys will be the Pb-free solder alloys of choice, with three to four alloys being identified for each of the different applications. Research on this topic continues at the present time at a vigorous pace, in view of the imminence of the issue.

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Citations
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Journal ArticleDOI

Corrosion Behavior of Sn-3.0Ag-0.5Cu Lead-Free Solder in Potassium Hydroxide Electrolyte

TL;DR: In this article, the corrosion behavior of Sn-3.0Ag-0.5Cu (SAC305) solder alloy in 6-M potassium hydroxide electrolyte was investigated using polarization analysis.
Journal ArticleDOI

The reliability of lead-free solder joint subjected to special environment: a review

TL;DR: In this article, a systematic review of the progress on the reliability investigation of lead-free solder joint is given to try to provide some theoretical support for the further investigation and application of leadfree solder alloy.
Journal ArticleDOI

Interfacial reactions of Sn-Cu solder with Ni/Au surface finish on Cu pad during reflow and aging in ball grid array packages

TL;DR: In this article, an investigation is reported on the interfacial reactions of Sn0.7Cu (wt.%) solder on electrolytic Ni layer for different times of reflow and solid-state aging.
Journal ArticleDOI

Review of microstructure and properties of low temperature lead-free solder in electronic packaging.

TL;DR: The review evaluates the effects of alloying elements, rare earth elements and nanoparticles on the wettability, microstructure, mechanical properties and oxidation resistance of the low-temperature solders.
Journal ArticleDOI

The interfacial reaction between Sn–Ag alloys and Co substrate

TL;DR: In this article, only one intermetallic compound (IMC), CoSn 3, was detected as a product of interfacial reaction, although there are several other IMCs in the Co-Sn binary system.
References
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Journal ArticleDOI

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Journal ArticleDOI

Interdiffusion and Reaction in Bimetallic Cu-Sn Thin Films

TL;DR: In this article, a Seemann-Bohlin diffractometer was used to investigate interdiffusion and intermetallic compound formation in Cu-Sn thin film couples.
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