Journal ArticleDOI
Measurement technologies for precision positioning
Wei Gao,Seung-Woo Kim,Harald Bosse,Han Haitjema,Y.L. Chen,X.D. Lu,Wolfgang Knapp,Albert Weckenmann,William T. Estler,H. Kunzmann +9 more
TLDR
In this paper, a review of measurement technologies for precision positioning in manufacturing industries is presented, followed by a discussion on traceability and standards, and some advanced applications of measurement technology for manufacturing industries.Abstract:
Precision positioning of an object relative to a reference point is a common task in many activities of production engineering. Sensor technologies for single axis measurement, either linear or rotary, which form the fundamentals of measurement technologies for precision positioning, are reviewed. Multi-axis coordinate measurement methods such as triangulation and multilateration, as well as Cartesian and polar systems for specifying the position in a plane or three-dimensional (3D) space are then presented, followed by a discussion on traceability and standards. Some advanced applications of measurement technologies for precision positioning in manufacturing industries are also demonstrated.read more
Citations
More filters
Journal ArticleDOI
On-machine and in-process surface metrology for precision manufacturing
Wei Gao,Han Haitjema,Fengzhou Fang,Fengzhou Fang,Richard Leach,Chi Fai Cheung,Enrico Savio,Jean-Marc Linares +7 more
TL;DR: Error separation algorithms for removing machine tool errors, which is specially required in on-machine and in-process surface metrology, are overviewed, followed by a discussion on calibration and traceability.
Journal ArticleDOI
Nanomanufacturing—Perspective and applications
TL;DR: Nanomanufacturing involves scaled-up, reliable, and cost-effective manufacturing of nanoscale materials, structures, devices, and systems as mentioned in this paper, which can be classified into top-down and bottom-up approaches, including additive, subtractive, and replication/mass conservation processes.
Journal ArticleDOI
Process chains for high-precision components with micro-scale features
Eckart Uhlmann,Brigid Mullany,Dirk Biermann,Kamlakar P Rajurkar,Tino Hausotte,Ekkard Brinksmeier +5 more
TL;DR: In this article, a review of capabilities and advances in micro-manufacturing technologies, metrology, and equipment demonstrates increased versatility across varied applications, while also highlighting limitations, and a guide for machining high-precision components with micro-scale features in process chains is given with respect to machine tools, tools, technology and environmental conditions.
Journal ArticleDOI
A New Capacitive Displacement Sensor With Nanometer Accuracy and Long Range
TL;DR: In this article, a highly stable motion with orthogonally alternating electric field is established to build the relationship between spatial displacement and time standards, and displacement is measured by counting the time pulses that serve as measurement standards.
Journal ArticleDOI
Displacement measuring grating interferometer: a review
Pengcheng Hu,Pengcheng Hu,Di Chang,Di Chang,Jiubin Tan,Jiubin Tan,Ruitao Yang,Ruitao Yang,Hongxing Yang,Hongxing Yang,Haijin Fu,Haijin Fu +11 more
TL;DR: The development of incremental displacement measuring grating interferometers achieved in recent years is summarized in detail, and studies on error analysis of a grates interferometer are briefly introduced.
References
More filters
Book ChapterDOI
International Organization for Standardization ISO/IEC 17025 General Requirements for the Competence of Testing and Calibration Laboratories
Journal ArticleDOI
Carrier-envelope phase control of femtosecond mode-locked lasers and direct optical frequency synthesis
David J. Jones,Scott A. Diddams,Jinendra Kumar Ranka,Andrew John Stentz,Robert S. Windeler,John L. Hall,Steven T. Cundiff +6 more
TL;DR: The carrier-envelope phase of the pulses emitted by a femtosecond mode-locked laser is stabilized by using the powerful tools of frequency-domain laser stabilization to perform absolute optical frequency measurements that were directly referenced to a stable microwave clock.
Journal ArticleDOI
The Refractive Index of Air
TL;DR: In this article, the authors presented an improved dispersion formula for standard air, (n − 1)s × 108 = 8342, where σ is the vacuum wave-number in μm-1.
Journal ArticleDOI
Refractive index of air: new equations for the visible and near infrared
TL;DR: This work critically reviewed recent research at the National Physical Laboratory, the International Bureau of Weights and Measures, and elsewhere that has led to revised formulas and data for the dispersion and density of the major components of the atmosphere to yield a set of equations that match recently reported measurements to within the experimental error.
Journal ArticleDOI
Colloquium: Femtosecond optical frequency combs
Steven T. Cundiff,Jun Ye +1 more
TL;DR: In this paper, the authors review the frequency-domain description of a mode-locked laser and the connection between the pulse phase and the frequency spectrum in order to provide a basis for understanding how the absolute frequencies can be determined and controlled.