Journal ArticleDOI
Polycrystalline thin film ZnSexTe1-x: preparation and properties
TLDR
ZnSexTe1-x films were prepared by co-evaporating ZnSe and ZnTe powders from a two-zone hot wall evaporation jig onto glass substrates.Abstract:
ZnSexTe1-x films were prepared by co-evaporating ZnSe and ZnTe powders from a two-zone hot wall evaporation jig onto glass substrates. The optical band gaps for different x were determined and this showed a bowing behaviour. The refractive indices and extinction coefficients have been determined as a function of wavelength. Variations of surface roughness with composition and microstructural details were also reported. Grain boundary scattering effects were found to be a dominant factor controlling electron transport processes in these films.read more
Citations
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Microstructure and optical studies of electron beam evaporated ZnSe1−xTex nanocrystalline thin films
TL;DR: In this paper, the structure and optical properties of nanocrystalline thin films of ZnSe 1− x Te x (0.0, x ǫ ≥ 1.0) were examined using X-ray diffraction technique and revealed that the deposited films have polycrystalline zinc blend structure with lattice constant, a, increasing linearly from 0.55816 to 0.59989 nm as x varies from 0 to 1.
Journal ArticleDOI
Thickness-dependent nonlinear absorption behaviors in polycrystalline ZnSe thin films
TL;DR: In this paper, the life time of localized defect states on grain boundary was found to be ~ 3 ns from ultrafast pump-probe spectroscopy for polycrystalline ZnSe thin films.
Journal ArticleDOI
Optical characterization of polycrystalline ZnSe1−xTex thin films using variable angle spectroscopic ellipsometry and spectrophotmetery techniques
TL;DR: In this article, the optical properties of polycrystalline ZnSe1−xTex (0.0≤x≤1.0) thin films were compared using variable angle spectroscopic ellipsometry (VASE) and spectrophotometry.
Journal ArticleDOI
Metalorganic chemical vapor deposition of ZnSe films on glass and GaAs(111) substrates
TL;DR: In this paper, the authors studied the low-temperature growth and doping of polycrystalline ZnSe by MOCVD using ditertiary-butylselenide (DtBSe) and dimethylzinc-triethylamine (DMZn-TEN) precursors.
Journal ArticleDOI
Structural and optical analyses of polycrystalline Zn1−xSbxSe thin films prepared by resistive heating technique
Rashad Rashid,Arshad Mahmood,U. Aziz,A. Shah,Zahid Ali,Q. Raza,Abdul Malik,Muhammad Asim Rasheed +7 more
TL;DR: In this paper, the influence of Sb doping on the structural and optical properties of Zn 1− x Sb x Se (0,⩽, x ǫ⩾ 0.15) thin films prepared by thermal evaporation technique on glass substrate was reported.
References
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Journal ArticleDOI
The electrical properties of polycrystalline silicon films
TL;DR: In this article, Boron doses of 1×1012-5×1015/cm2 were implanted at 60 keV into 1-μm-thick polysilicon films and Hall and resistivity measurements were made over a temperature range −50-250 °C.
Journal ArticleDOI
Transport properties of polycrystalline silicon films
TL;DR: In this article, the transport properties of polycrystalline silicon films are examined and interpreted in terms of a modified grain-boundary trapping model, based on the assumption of both a δ-shaped and a uniform energy distribution of interface states.
Journal ArticleDOI
Toward a Unified Theory of Urbach's Rule and Exponential Absorption Edges
John D. Dow,David Redfield +1 more
TL;DR: In this paper, a unified theory of exponetial absorption edges must rely on electric microfields as the cause, including exciton effects and the final-state interaction between the electron and the hole, and ascribe Urbach's rule to the relative, internal motion of the exciton.
Journal ArticleDOI
Electroabsorption in Semiconductors: The Excitonic Absorption Edge
John D. Dow,David Redfield +1 more
TL;DR: In this paper, the optical absorption coefficient for direct, excitonic transitions in a uniform applied electric field is calculated and the electron-hole scattering is treated within the effective mass approximation and leads to an absorption coefficient which differs markedly in size and shape from the Franz-Keldysh absorption spectrum.
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Bandgap and optical transitions in thin films from reflectance measurements
TL;DR: In this paper, a new formulation and method are presented for evaluating bandgap, optical transitions and optical constants from the reflectance data for films deposited onto a non-absorbing substrate, which can be used to evaluate the optical properties of the films.