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Surface chemistry of atomic layer deposition: A case study for the trimethylaluminum/water process

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TLDR
In this paper, the surface chemistry of the trimethylaluminum/water ALD process is reviewed, with an aim to combine the information obtained in different types of investigations, such as growth experiments on flat substrates and reaction chemistry investigation on high-surface-area materials.
Abstract
Atomic layer deposition(ALD), a chemical vapor deposition technique based on sequential self-terminating gas–solid reactions, has for about four decades been applied for manufacturing conformal inorganic material layers with thickness down to the nanometer range. Despite the numerous successful applications of material growth by ALD, many physicochemical processes that control ALD growth are not yet sufficiently understood. To increase understanding of ALD processes, overviews are needed not only of the existing ALD processes and their applications, but also of the knowledge of the surface chemistry of specific ALD processes. This work aims to start the overviews on specific ALD processes by reviewing the experimental information available on the surface chemistry of the trimethylaluminum/water process. This process is generally known as a rather ideal ALD process, and plenty of information is available on its surface chemistry. This in-depth summary of the surface chemistry of one representative ALD process aims also to provide a view on the current status of understanding the surface chemistry of ALD, in general. The review starts by describing the basic characteristics of ALD, discussing the history of ALD—including the question who made the first ALD experiments—and giving an overview of the two-reactant ALD processes investigated to date. Second, the basic concepts related to the surface chemistry of ALD are described from a generic viewpoint applicable to all ALD processes based on compound reactants. This description includes physicochemical requirements for self-terminating reactions,reaction kinetics, typical chemisorption mechanisms, factors causing saturation, reasons for growth of less than a monolayer per cycle, effect of the temperature and number of cycles on the growth per cycle (GPC), and the growth mode. A comparison is made of three models available for estimating the sterically allowed value of GPC in ALD. Third, the experimental information on the surface chemistry in the trimethylaluminum/water ALD process are reviewed using the concepts developed in the second part of this review. The results are reviewed critically, with an aim to combine the information obtained in different types of investigations, such as growth experiments on flat substrates and reaction chemistry investigation on high-surface-area materials. Although the surface chemistry of the trimethylaluminum/water ALD process is rather well understood, systematic investigations of the reaction kinetics and the growth mode on different substrates are still missing. The last part of the review is devoted to discussing issues which may hamper surface chemistry investigations of ALD, such as problematic historical assumptions, nonstandard terminology, and the effect of experimental conditions on the surface chemistry of ALD. I hope that this review can help the newcomer get acquainted with the exciting and challenging field of surface chemistry of ALD and can serve as a useful guide for the specialist towards the fifth decade of ALD research.

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Citations
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High dielectric constant gate oxides for metal oxide Si transistors

TL;DR: In this article, a review of the development of high-k gate oxides such as hafnium oxide (HFO) and high-K oxides is presented, with the focus on the work function control in metal gate electrodes.
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Platinum single-atom and cluster catalysis of the hydrogen evolution reaction

TL;DR: A practical synthesis method to produce isolated single platinum atoms and clusters using the atomic layer deposition technique and indicates that the partially unoccupied density of states of the platinum atoms' 5d orbitals on the nitrogen-doped graphene are responsible for the excellent performance.
Journal ArticleDOI

A brief review of atomic layer deposition: from fundamentals to applications

TL;DR: Atomic layer deposition (ALD) is a vapor phase technique capable of producing thin films of a variety of materials as discussed by the authors, including metal oxides such as Zn1−xSnxOy, ZrO2, Y2O3, and Pt.
Journal ArticleDOI

Crystallinity of inorganic films grown by atomic layer deposition: Overview and general trends

TL;DR: Puurunen et al. as discussed by the authors summarized the two-reactant ALD processes to grow inorganic materials developed to-date, updating the information of an earlier review on ALD.
References
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Journal ArticleDOI

Growth of boron-doped ZnO thin films by atomic layer deposition

TL;DR: In this paper, it was shown that the electrical properties of ZnO films strongly depend on the injected amount of B 2 H 6 during the deposition and on the injection timing of B2 H 6 relating to DEZn and H 2 O.
Journal ArticleDOI

Thin film deposition of lanthanum manganite perovskite by the ALE process

TL;DR: In this article, the authors demonstrated the deposition of thin films of LaMnO from β-diketonate-type precursors and ozone in an ALE reactor.
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Atomic level epitaxy of 3C-SiC by low pressure vapour deposition with alternating gas supply

TL;DR: In this article, the growth rate of 3C-SiC on Si substrates has been studied in a hot-wall-type, low pressure, chemical vapour deposition reactor with an alternating supply of SiH 2 Cl 2 and C 2 H 2 in the temperature range of 750-1050°C.
Journal ArticleDOI

Atomic layer epitaxy of GaInP ordered alloy

TL;DR: In this article, the growth of ordered GaInP by atomic layer epitaxy on a GaAs substrate was reported, and the growth was achieved by alternate exposures to TEI, PH3, TMGa, and PH3 fluxes, and epilayers were found to closely match the substrate irrespective of the growth conditions.
Journal ArticleDOI

Atomic Layer Deposition of Al2O3 Thin Films from a 1-Methoxy-2-methyl-2-propoxide Complex of Aluminum and Water

TL;DR: Al2O3 thin films were grown by atomic layer deposition (ALD) using the novel volatile complex Al(mmp)3 (mmp = 1-methoxy-2-methyl-2propoxide, OCMe2CH2OMe) and water vapor in the temperature range o...
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