Journal ArticleDOI
Sample preparation for atomic-resolution STEM at low voltages by FIB.
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TLDR
All sample preparation has been carried out in modern Dual-Beam FIB microscopes capable of low-kV Ga(+) ion milling, but without additional preparation steps after the FIB lift-out procedure.About:
This article is published in Ultramicroscopy.The article was published on 2012-03-01. It has received 332 citations till now. The article focuses on the topics: Ion milling machine & Sample preparation.read more
Citations
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Light-emitting diodes by band-structure engineering in van der Waals heterostructures
Freddie Withers,O. Del Pozo-Zamudio,Artem Mishchenko,A. P. Rooney,Ali Gholinia,Kenji Watanabe,T. Taniguchi,Sarah J. Haigh,Andre K. Geim,Alexander I. Tartakovskii,Kostya S. Novoselov +10 more
TL;DR: In this paper, the authors describe light-emitting diodes (LEDs) made by stacking metallic graphene, insulating hexagonal boron nitride and various semiconducting monolayers into complex but carefully designed sequences.
Journal ArticleDOI
Light-emitting diodes by bandstructure engineering in van der Waals heterostructures
F. Withers,O. Del Pozo-Zamudio,Artem Mishchenko,A. P. Rooney,Ali Gholinia,Kenji Watanabe,T. Taniguchi,Sarah J. Haigh,A. K. Geim,Alexander I. Tartakovskii,K. S. Novoselov +10 more
TL;DR: It is shown that light-emitting diodes made by stacking metallic graphene, insulating hexagonal boron nitride and various semiconducting monolayers into complex but carefully designed sequences can also provide the basis for flexible and semi-transparent electronics.
Journal ArticleDOI
Cross-sectional imaging of individual layers and buried interfaces of graphene-based heterostructures and superlattices.
Sarah J. Haigh,Ali Gholinia,Rashid Jalil,S. Romani,L. Britnell,D. C. Elias,Kostya S. Novoselov,L. A. Ponomarenko,Andre K. Geim,Roman V. Gorbachev +9 more
TL;DR: In this paper, a cross sectional TEM view of several graphene and boron nitride heterostructures is presented, showing that the trapped hydrocarbons segregate into isolated pockets, leaving the interfaces atomically clean.
Journal ArticleDOI
Molecular transport through capillaries made with atomic-scale precision
Boya Radha,Ali Esfandiar,FengChao Wang,A. P. Rooney,Kalon Gopinadhan,Ashok Keerthi,Artem Mishchenko,A. Janardanan,Peter Blake,Laura Fumagalli,M. Lozada-Hidalgo,Slaven Garaj,Sarah J. Haigh,Irina V. Grigorieva,HengAn Wu,Andre K. Geim +15 more
TL;DR: This work reports the fabrication of narrow and smooth capillaries through van der Waals assembly, with atomically flat sheets at the top and bottom separated by spacers made of two-dimensional crystals with a precisely controlled number of layers, using graphene and its multilayers as archetypalTwo-dimensional materials to demonstrate this technology.
Journal ArticleDOI
Quality Heterostructures from Two-Dimensional Crystals Unstable in Air by Their Assembly in Inert Atmosphere
Yang Cao,Artem Mishchenko,Geliang Yu,Ekaterina Khestanova,A. P. Rooney,Eric Prestat,Andrey V. Kretinin,Peter Blake,Moshe Ben Shalom,Colin R. Woods,J. Chapman,Geetha Balakrishnan,Irina V. Grigorieva,Konstantin S. Novoselov,Benjamin A. Piot,Marek Potemski,Kenji Watanabe,T. Taniguchi,Sarah J. Haigh,Andre K. Geim,Roman V. Gorbachev +20 more
TL;DR: A remedial approach based on cleavage, transfer, alignment, and encapsulation of air-sensitive crystals, all inside a controlled inert atmosphere, which offers a venue to significantly expand the range of experimentally accessible two-dimensional crystals and their heterostructures.
References
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A review of focused ion beam milling techniques for TEM specimen preparation
TL;DR: The use of focused ion beam (FIB) milling for the preparation of transmission electron microscopy (TEM) specimens is described in this article, where the operation of the FIB instrument is discussed and the conventional and lift-out techniques for TEM specimen preparation and the advantages and disadvantages of each technique are detailed.
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Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy
David A. Muller,L. Fitting Kourkoutis,M.F. Murfitt,J. H. Song,J. H. Song,Harold Y. Hwang,John Silcox,Niklas Dellby,Ondrej L. Krivanek +8 more
TL;DR: Using a fifth-order aberration-corrected scanning transmission electron microscope, which provides a factor of 100 increase in signal over an uncorrected instrument, two-dimensional elemental and valence-sensitive imaging at atomic resolution is demonstrated by means of electron energy-loss spectroscopy.
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Review of Atom Probe FIB-Based Specimen Preparation Methods
TL;DR: Several FIB-based methods that have been developed to fabricate needle-shaped atom probe specimens from a variety of specimen geometries, and site-specific regions are reviewed, which have enabled electronic device structures to be characterized.
Journal ArticleDOI
Element-selective imaging of atomic columns in a crystal using STEM and EELS
TL;DR: In this article, the atomic columns of La, Mn and O in the layered manganite La1.2Sr1.8Mn2O7 are visualized as two-dimensional images.