Open AccessJournal Article
Statistical optics
TLDR
Development of this more comprehensive model of the behavior of light draws upon the use of tools traditionally available to the electrical engineer, such as linear system theory and the theory of stochastic processes.Abstract:
Course Description This is an advanced course in which we explore the field of Statistical Optics. Topics covered include such subjects as the statistical properties of natural (thermal) and laser light, spatial and temporal coherence, effects of partial coherence on optical imaging instruments, effects on imaging due to randomly inhomogeneous media, and a statistical treatment of the detection of light. Development of this more comprehensive model of the behavior of light draws upon the use of tools traditionally available to the electrical engineer, such as linear system theory and the theory of stochastic processes.read more
Citations
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Survey on Free Space Optical Communication: A Communication Theory Perspective
TL;DR: An up-to-date survey on FSO communication systems is presented, describing FSO channel models and transmitter/receiver structures and details on information theoretical limits of FSO channels and algorithmic-level system design research activities to approach these limits are provided.
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Focusing coherent light through opaque strongly scattering media
Ivo M. Vellekoop,Allard Mosk +1 more
TL;DR: Focusing of coherent light through opaque scattering materials by control of the incident wavefront with a brightness up to a factor of 1000 higher than the brightness of the normal diffuse transmission is reported.
Journal ArticleDOI
Femtosecond diffractive imaging with a soft-X-ray free-electron laser
Henry N. Chapman,Henry N. Chapman,Anton Barty,Michael J. Bogan,Sébastien Boutet,Sébastien Boutet,Sébastien Boutet,Matthias Frank,Stefan P. Hau-Riege,Stefano Marchesini,Stefano Marchesini,Bruce W. Woods,Saša Bajt,W. Henry Benner,Richard A. London,Richard A. London,Elke Plönjes,Marion Kuhlmann,Rolf Treusch,Stefan Düsterer,Thomas Tschentscher,Jochen R. Schneider,Eberhard Spiller,Thomas Möller,Christoph Bostedt,Matthias Hoener,David A. Shapiro,Keith O. Hodgson,David van der Spoel,F. Burmeister,M. Bergh,Carl Caleman,G. Huldt,M. Marvin Seibert,Filipe R. N. C. Maia,Richard W. Lee,Richard W. Lee,Abraham Szöke,Abraham Szöke,Nicusor Timneanu,Janos Hajdu,Janos Hajdu +41 more
TL;DR: In this paper, the FLASH soft X-ray free-electron laser was used to reconstruct a coherent diffraction pattern from a nano-structured nonperiodic object, before destroying it at 60,000 K.
Journal ArticleDOI
A Global Assessment of the SRTM Performance
TL;DR: The NASA/NGA Shuttle Radar Topography Mission (SRTM) collected interferometric radar data which has been used by the Jet Propulsion Laboratory to generate a near-global topography data product for latitudes smaller than 60° as mentioned in this paper.
Journal ArticleDOI
In vivo confocal scanning laser microscopy of human skin II: advances in instrumentation and comparison with histology.
Milind Rajadhyaksha,Milind Rajadhyaksha,Salvador González,James M. Zavislan,R. Rox Anderson,Robert H. Webb +5 more
TL;DR: A small, portable, and robust confocal microscope that is capable of imaging normal and abnormal skin morphology and dynamic processes in vivo, in both laboratory and clinical settings is built.
References
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Dissertation
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TL;DR: In this article, the authors present a configuration experimentalement pertinente, a savoir les oscillations dipolaires d'un condensat en presence d'impuretes.
Proceedings ArticleDOI
Shot noise and process window study for printing small contact holes using EUV lithography
TL;DR: A theoretical analysis of the capability of Extreme Ultra-violet Lithography (EUVL) to print contacts in the range of 30-50 nm with acceptable yield is presented in this paper, where shot noise is modeled as a simple statistical fluctuation of the number of photons absorbed in a given contact.
Journal ArticleDOI
Moment-Based Approach for Statistical and Simulative Analysis of Turbulent Atmospheric Channels in FSO Communication
TL;DR: A unified approach for the performance analysis of the Log-normal, Nakagami-n (Rician), and Rayleigh statistical models is presented by deriving the exact closed-form expressions for average bit error probability and the outage probability of each model.