Institution
Actel
About: Actel is a based out in . It is known for research contribution in the topics: Antifuse & Field-programmable gate array. The organization has 364 authors who have published 402 publications receiving 12674 citations.
Topics: Antifuse, Field-programmable gate array, Layer (electronics), Programmable logic array, Transistor
Papers published on a yearly basis
Papers
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10 Aug 1988TL;DR: The first stage uses a source follower to feed a set of dual complimentary current mirrors, which convert the voltage difference supplied by the source follower into a current as mentioned in this paper, which is mirrored into the second stage by opposing pulldown and pull-up current mirrors from the first stage.
Abstract: The high-speed static differential sense amplifier of the present invention is composed of two stages. The first stage uses a source follower to feed a set of dual complimentary current mirrors. The current mirrors in the source of the input devices convert the voltage difference supplied by the source follower into a current. This current is mirrored into the second stage by opposing pull-down and pull-up current mirrors from the first stage. The second stage current difference produces the large voltage swings needed to drive the digital logic.
33 citations
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03 May 1995TL;DR: In this article, an antifuse measuring the resistance of an integrated circuit is integrated on the same integrated circuit as the antifuses and is controlled by a programming circuit disposed on the integrated circuit and comprises a first voltage sensing transistor having a first drain/source electrically connected to a first I/O pad, a gate electrically connecting to the programming circuit, and a second drain/sensor connected to the first electrode.
Abstract: Apparatus for measuring the resistance of a programmed antifuse in an integrated circuit is integrated on the same integrated circuit as the antifuse and is controlled by a programming circuit disposed on an integrated circuit and comprises a first voltage sensing transistor having a first drain/source electrically connected to a first I/O pad, a gate electrically connected to the programming circuit, and a second drain/source electrically connected to a first electrode of the antifuse, and a second voltage sensing transistor having a first drain/source electrically connected to a second I/O pad, a gate electrically connected to the programming circuit, and a second drain/source electrically connected to a second electrode of the antifuse.
33 citations
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12 Apr 1990TL;DR: In this paper, a minimum sized aperture for a reduced capacitance anti-fuse or other structure may be formed by birds beak encroachment of thick oxide under a masking layer or by isotropic etching of masking layers.
Abstract: A minimum sized aperture for a reduced capacitance anti-fuse or other structure may be formed by birds beak encroachment of thick oxide under a masking layer or by isotropic etching of a masking layer followed by birds beak encroachment of thick oxide.
32 citations
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01 Mar 2008TL;DR: Heavy-ion and proton test results utilizing novel test methodologies of reprogrammable and non-volatile flash-based FPGAs are presented and discussed and shows no major concern or disruption to all of the circuit features.
Abstract: Heavy-ion and proton test results utilizing novel test methodologies of reprogrammable and non-volatile flash-based FPGAs are presented and discussed. The 5 programmable architectures in the A3P FPGA-family were tested: I/O structures, FPGA Core, PLL, FROM and SRAM. Furthermore, the circuitry used for the programming and the erase of the A3P product was exercised in proton beams. The data shows no major concern or disruption to all of the circuit features for fluences lower than 1011 particles or TID higher than 15 Krad.
32 citations
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10 Jan 1989TL;DR: In this article, a high voltage detector senses the presence or absence of a voltage exceeding a preselected threshold on the input-output pad, and assumes a first state if the voltage on the output pad exceeds the threshold, and a second state if it does not exceed the threshold.
Abstract: A circuit is provided for switching an internal bus of an integrated circuit between an input/output pad on the integrated circuit and a circuit node of the integrated circuit. A first switch is connected between the input/output pad and the internal bus. A second switch is connected between the circuit node and the internal bus. A high voltage detector senses the presence or absence of a voltage exceeding a preselected threshold on the input-output pad. The high voltage detector assumes a first state if the voltage on the input/output pad exceeds the preselected threshold, and assumes a second state if the voltage on the input/output pad does not exceed the preselected threshold. Switch control circuitry responsive to the high voltage detector activates either the first or second switch depending upon the output of the high voltage detector. Circuitry is provided to prevent the first and second switches from being active simultaneously and for lowering the capacitance of the input/output pad.
31 citations
Authors
Showing all 364 results
Name | H-index | Papers | Citations |
---|---|---|---|
Chenming Hu | 119 | 1296 | 57264 |
Abbas El Gamal | 59 | 221 | 20609 |
John L. McCollum | 34 | 132 | 4237 |
Sen-ching S. Cheung | 31 | 103 | 3925 |
Jonathan W. Greene | 26 | 69 | 3620 |
Abdul Rahim Forouhi | 22 | 44 | 2207 |
Ashvinkumar J. Sanghvi | 19 | 39 | 1069 |
Andrew Kennings | 17 | 59 | 823 |
Gregory Bakker | 17 | 35 | 1045 |
Frank Hawley | 16 | 52 | 865 |
Esmat Z. Hamdy | 16 | 32 | 1561 |
William C. Plants | 16 | 30 | 955 |
Fei Li | 15 | 20 | 1065 |
Yinming Sun | 15 | 24 | 663 |
Sinan Kaptanoglu | 15 | 31 | 767 |