Journal ArticleDOI
Dielectric Relaxation of MIM Capacitor and Its Effect on Sigma-Delta A/D Converters
Zhenqiu Ning,H. Casier,J. De Maeyer,E. Heirman,E. de Vylder,K. Noldus,G. Van Herzeele,D. Hegsted +7 more
- Vol. 21, Iss: 4, pp 549-564
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TLDR
In this paper, the effect of the dielectric relaxation on the circuit performance of high resolution sigma-delta ADC has been analyzed for simulation, and it was shown that the noise shaping which is enforced by the integrators in SigmaDelta-ADC is almost not affected by the deformation.Abstract:
Dielectric relaxation of capacitors is one of the error sources when determining the accuracy of analog sampled-data systems that are based on charge storage. To perform an accurate characterization of the dielectric relaxation of metal-insulator-metal (MIM) capacitor, techniques based on the voltage recovery principle and the Curie Von Schweidler discharge current approach are developed. To model the dielectric relaxation of the MIM capacitor, Dow's model is selected. An algorithm for the model parameter extraction on the Curie Von Schweidler current has been developed, which shows the phenomenon of dielectric relaxation in detail and is very fast to determine the parameters. Based on the measurement data, a set of model parameters is extracted and verified, which approximates the Curie Von Schweidler law over a sufficiently wide interval of time constants. To study the effect of the dielectric relaxation on the circuit performance of high resolution sigma-delta ADC, a 12-b incremental ADC has been selected as an example for simulation. The simulation results show that the effect of the dielectric relaxation on the performance of the 12-b ADC is not significant. We show that the .major reason for this is that the noise shaping which is enforced by the integrators in SigmaDelta-ADC is almost not affected by the dielectric relaxation phenomenon.read more
Citations
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Journal ArticleDOI
A Novel Method for Phasor Measurement Unit Sampling Time Error Compensation
Wenxuan Yao,Lingwei Zhan,Yong Liu,Micah J. Till,Jiecheng Zhao,Ling Wu,Zhaosheng Teng,Yilu Liu +7 more
TL;DR: The simulation and experiment results validate the effectiveness and accuracy of the proposed variable sampling interval control method, which is believed to be able to greatly improve the performance of PPS-disciplined synchronous sampling methods in PMUs.
Proceedings ArticleDOI
Comparator with built-in reference voltage generation and split-ROM encoder for a high-speed flash ADC
TL;DR: In this article, two circuit techniques for performance enhancement of high-speed flash ADCs are proposed: a calibration-intensive dynamic comparator features an improved built-in reference voltage generation scheme to alleviate the issue of kickback noise and a proper reset function to clean the memory effect due to the dielectric relaxation in the capacitors, yielding better static and dynamic linearity performances.
Posted Content
Origin of the Curie-von Schweidler law and the fractional capacitor from time-varying capacitance
Thomas Ulmer,Vikash Pandey +1 more
TL;DR: In this paper, the authors derived the Curie-von Schweidler law from a series combination of a resistor and a capacitor with a linearly time-varying capacitance.
Journal ArticleDOI
Degradation analysis and characterization of multifilamentary conduction patterns in high-field stressed atomic-layer-deposited TiO2/Al2O3 nanolaminates on GaAs
TL;DR: In this article, the effects of applying a high-field electrical stress on TiO2/Al2O3 nanolaminates grown by atomic layer deposition onto a p-type GaAs substrate are investigated.
Journal ArticleDOI
An extension of the Curie-von Schweidler law for the leakage current decay in MIS structures including progressive breakdown
TL;DR: It is shown that the Curie-von Schweidler law in combination with series and parallel resistances can describe the observed current decrease in these structures accurately and is able to capture the main features exhibited by the current–time characteristic in both cases.
References
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Book
Understanding Delta-Sigma Data Converters
TL;DR: This chapter discusses the design and simulation of delta-sigma modulator systems, and some of the considerations for implementation considerations for [Delta][Sigma] ADCs.
Journal ArticleDOI
An empirical study of high-order single-bit delta-sigma modulators
TL;DR: Plots of the maximum signal-to-noise ratio (SNR) achievable with a given modulator order and oversampling ratio (OSR) are presented and can be used to determine the modulator orders required to achieve a given SNR or to check the tightness of theoretical bounds.
Proceedings ArticleDOI
A comparative study of dielectric relaxation losses in alternative dielectrics
Hans Reisinger,G. Steinlesberger,S. Jakschik,M. Gutsche,T. Hecht,M. Leonhard,Uwe Schröder,H. Seidl,D. Schumann +8 more
TL;DR: In this article, the effect of dielectric relaxation on DRAM storage capacitors and gate dielectrics of MOSFETs is investigated and compared with those in standard insulators.
Journal ArticleDOI
Digital background calibration for memory effects in pipelined analog-to-digital converters
TL;DR: Two new calibration algorithms are proposed that correct for memory errors by digital post-processing of the ADC output that operate in the background and so do not require conversion to be interrupted in order to track changes due to temperature and supply variations.
Journal ArticleDOI
A study of relaxation current in high-/spl kappa/ dielectric stacks
Zhen Xu,Luigi Pantisano,A. Kerber,Robin Degraeve,E. Cartier,S. De Gendt,M.M. Heyns,Guido Groeseneken +7 more
TL;DR: In this article, the authors studied the thickness dependence, gate voltage polarity dependence and temperature dependence of the relaxation current in high/spl kappa/ dielectric stacks and concluded that the relaxation currents are mainly due to the traps located near the SiO/sub 2/high/spl Kappa/ interface.