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Journal ArticleDOI

Optical properties of thin films

David E. Aspnes
- 19 Mar 1982 - 
- Vol. 89, Iss: 3, pp 249-262
TLDR
In this article, the connection between microstructure and absolute limits to the allowed values of the dielectric response of two-phase composites is reviewed and a solution of the Clausius-Mossotti problem is developed from basic principles.
About
This article is published in Thin Solid Films.The article was published on 1982-03-19. It has received 1433 citations till now. The article focuses on the topics: Surface roughness & Isotropy.

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Citations
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Journal ArticleDOI

Modeling of Absorption Induced by Space Radiation on Glass: A Two-Variable Function Depending on Radiation Dose and Post-Irradiation Time

TL;DR: In this paper, the effects of gamma radiation on the glass optical properties have been analyzed from transmission measurements and ellipsometric characterization, and an exponential function is proposed to describe the absorption increase when the total dose rises.
Journal ArticleDOI

Properties of inhomogeneous amorphous and polycrystalline semiconductor films

A.H. Clark
- 21 Oct 1983 - 
TL;DR: In this paper, the electrical and optical properties of inhomogeneous semiconductors are reviewed from the perspective of effective medium approximations (EMAs) for modeling the effects of microstructure on optical properties.
Journal ArticleDOI

Spectroscopic Ellipsometry Studies of n-i-p Hydrogenated Amorphous Silicon Based Photovoltaic Devices

TL;DR: The nucleation and evolution of crystallites forming from the amorphous phase were studied using in situ near-infrared to ultraviolet spectroscopic ellipsometry during growth of films prepared as a function of hydrogen to reactive gas flow ratio R = [H2]/[SiH4].
Journal ArticleDOI

In situ and real-time ellipsometry diagnostic techniques towards the monitoring of the bonding structure and growth kinetics: silicon oxide coatings

TL;DR: In this paper, a modern methodology concerning the applicability of in situ and real-time optical diagnostic techniques for the study of the optical properties, bonding structure evolution during film growth, in the case of silicon oxide films deposited by e-beam evaporation was presented.
Journal ArticleDOI

Temperature dependence of the dielectric function and critical points of α-SnS from 27 to 350 K.

TL;DR: The temperature dependences of the dielectric function and critical point (CP) energies of biaxial α-SnS were determined by fitting the data to the phenomenological expression that contains the Bose–Einstein statistical factor and the temperature coefficient for describing the electron–phonon interaction.
References
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Book

Classical Electrodynamics

Book

Ellipsometry and polarized light

TL;DR: In this article, the polarization of light waves and propagation of polarized light through polarizing optical systems are discussed. But the authors focus on the application of ellipsometry in the field of measurement in ellipsometer systems.
Journal ArticleDOI

A Variational Approach to the Theory of the Effective Magnetic Permeability of Multiphase Materials

TL;DR: In this article, the authors established and applied variational theorems for the derivation of bounds for the effective magnetic permeability of macroscopically homogeneous and isotropic multiphase materials.
Journal ArticleDOI

Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry

TL;DR: In this article, Bruggeman and Maxwell Garnett showed that the dielectric properties of microscopically rough layers of thicknesses 100-500 \AA{}A are accurately modeled in the effective medium approximation.
Book

Theory of electrons