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Journal ArticleDOI

Optical properties of thin films

David E. Aspnes
- 19 Mar 1982 - 
- Vol. 89, Iss: 3, pp 249-262
TLDR
In this article, the connection between microstructure and absolute limits to the allowed values of the dielectric response of two-phase composites is reviewed and a solution of the Clausius-Mossotti problem is developed from basic principles.
About
This article is published in Thin Solid Films.The article was published on 1982-03-19. It has received 1433 citations till now. The article focuses on the topics: Surface roughness & Isotropy.

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Citations
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Journal ArticleDOI

Molecular structure of SiOx-incorporated diamond-like carbon films; evidence for phase segregation

TL;DR: In this article, the properties of amorphous diamond-like carbon films were assessed as a function of Si concentration using pulsed direct current plasma-enhanced chemical vapour deposition (DC-PECVD).
Journal ArticleDOI

Spectroellipsometric, AFM and XPS probing of stainless steel surfaces subjected to biological influences

TL;DR: In this article, the surface modification of austenitic stainless steel (SS) 316L after incubation in growing cell cultures and cell-free media as control has been studied.
Journal ArticleDOI

Structural, optical and porosity properties of CdI2 thin film

TL;DR: The structural and optical properties of CdI 2 thin films, produced at different pH levels were analyzed by SEM; EDX analysis was performed for analyzing the surface properties and determining elemental ratio of the films as discussed by the authors.
Journal ArticleDOI

Real time in situ spectroscopic ellipsometry of the growth and plasmonic properties of AU nanoparticles on SiO2

TL;DR: In this article, the evolution of the film thickness and plasmonic properties for sputtered deposited Au nanoparticles on SiO2 layers have been monitored in real time using in situ spectroscopic ellipsometry in the photon energy range 0.75-4.1 eV.
Journal ArticleDOI

Optical properties of In2O3−SnO2 films in the transparent and plasma reflection region

TL;DR: In this article, the optical and electrical properties of r.f.sputtered In2O3−SnO2 films were investigated after a heat treatment and the results showed that the residual dielectric constant is independent of both the preparation conditions and the heat treatment.
References
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Book

Classical Electrodynamics

Book

Ellipsometry and polarized light

TL;DR: In this article, the polarization of light waves and propagation of polarized light through polarizing optical systems are discussed. But the authors focus on the application of ellipsometry in the field of measurement in ellipsometer systems.
Journal ArticleDOI

A Variational Approach to the Theory of the Effective Magnetic Permeability of Multiphase Materials

TL;DR: In this article, the authors established and applied variational theorems for the derivation of bounds for the effective magnetic permeability of macroscopically homogeneous and isotropic multiphase materials.
Journal ArticleDOI

Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry

TL;DR: In this article, Bruggeman and Maxwell Garnett showed that the dielectric properties of microscopically rough layers of thicknesses 100-500 \AA{}A are accurately modeled in the effective medium approximation.
Book

Theory of electrons