Journal ArticleDOI
Optical properties of thin films
TLDR
In this article, the connection between microstructure and absolute limits to the allowed values of the dielectric response of two-phase composites is reviewed and a solution of the Clausius-Mossotti problem is developed from basic principles.About:
This article is published in Thin Solid Films.The article was published on 1982-03-19. It has received 1433 citations till now. The article focuses on the topics: Surface roughness & Isotropy.read more
Citations
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Effects of Spacecraft Materials Outgassing Products on Cryogenic Surfaces
W T Bertrand,B E Wood +1 more
TL;DR: In this article, the authors present the refractive and absorptive indices of the condensed outgassing products of satellite materials which have been determined from the experimental measurements of infrared transmittance, and combine optical property data from two materials to provide values that can be used to calculate the surface effects for contaminant mixtures.
Optical Properties in PbHgS Ternary Thin Films Deposited by Solution Growth Method
B. A. Ezekoye,C.E. Okeke +1 more
TL;DR: PbHgS ternary thin films were grown on glass substrates at 300K by the electroless (solution-growth method) as discussed by the authors, and the as grown films were characterized for elemental composition using the energy dispersive X-ray fluorescence (EDXRF) and colorimetric methods.
Journal ArticleDOI
Simulating the opto-thermal processes involved in laser induced self-assembly of surface and sub-surface plasmonic nano-structuring
Dimitris V. Bellas,Dimosthenis Toliopoulos,Nikolaos Kalfagiannis,A Siozios,Petros Nikolaou,Pantelis C. Kelires,Demosthenes C. Koutsogeorgis,Panos Patsalas,Elefterios Lidorikis +8 more
TL;DR: In this paper, the photo-thermal processes involved in surface and sub-surface plasmonic nano-structuring were investigated and compared to experiments, and the proposed processes can serve as a platform that will stimulate further progress towards the engineering of plasmoronic devices.
Journal ArticleDOI
Real time spectroscopic ellipsometry study on growth processes of ZrO2 thin films in metallorganic chemical vapor deposition
TL;DR: In this article, the growth process of ZrO 2 thin films, deposited on Pt substrates by metallorganic chemical vapor deposition using zirconium tetraisopropoxide as a precursor, has been studied using a rotating-polarizer multichannel ellipsometer equipped with a charge-coupled device detector.
Journal ArticleDOI
Comparison of Si/SiO2 interface roughness from electron cyclotron resonance plasma and thermal oxidation
TL;DR: In this paper, the effects of microwave electron cyclotron resonance (ECR) plasma oxidation on smooth and purposely roughened Si surfaces were studied using atomic force microscopy with fractal analysis and the results were compared to thermal oxidation.
References
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Book
Ellipsometry and polarized light
TL;DR: In this article, the polarization of light waves and propagation of polarized light through polarizing optical systems are discussed. But the authors focus on the application of ellipsometry in the field of measurement in ellipsometer systems.
Journal ArticleDOI
A Variational Approach to the Theory of the Effective Magnetic Permeability of Multiphase Materials
Z. Hashin,S. Shtrikman +1 more
TL;DR: In this article, the authors established and applied variational theorems for the derivation of bounds for the effective magnetic permeability of macroscopically homogeneous and isotropic multiphase materials.
Journal ArticleDOI
Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
TL;DR: In this article, Bruggeman and Maxwell Garnett showed that the dielectric properties of microscopically rough layers of thicknesses 100-500 \AA{}A are accurately modeled in the effective medium approximation.