Journal ArticleDOI
Optical properties of thin films
TLDR
In this article, the connection between microstructure and absolute limits to the allowed values of the dielectric response of two-phase composites is reviewed and a solution of the Clausius-Mossotti problem is developed from basic principles.About:
This article is published in Thin Solid Films.The article was published on 1982-03-19. It has received 1433 citations till now. The article focuses on the topics: Surface roughness & Isotropy.read more
Citations
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Journal ArticleDOI
An ellipsometric and RBS study of TiSi2 formation
J.M.M. de Nijs,A. van Silfhout +1 more
TL;DR: In this article, the as-deposited layers, the intermediate states I and II, and the final state III have been characterized by means of spectroscopic ellipsometry (E = 2.0−4.5 eV).
Dissertation
Gestaltung der elektronischen Korrelationen in Perowskit-Heterostrukturen auf atomarer Skala
TL;DR: In this article, a new system for metalorganic aerosol deposition with growth control by in-situ ellipsometry was developed, where the transfer of electrons between different doped perovskite-manganites can be monitored throughout the growth.
Journal ArticleDOI
Spectroscopic ellipsometry and photoluminescence measurements of as-deposited and annealed silicon rich oxynitride films
Sandeep Kohli,Jeremy A. Theil,Patrick R. McCurdy,Patricia C. Dippo,Richard K. Ahrenkiel,Richard K. Ahrenkiel,Christopher D. Rithner,Peter K. Dorhout +7 more
TL;DR: In this article, the influence of annealing conditions on the photoluminescence spectra of silicon rich oxynitride films has been investigated and a correlation was seen between the changes in the refractive index, optical band gap, E 04 (energy corresponding to an absorption coefficient of 10 4 ǫ cm − 1 ) and Urbach Energy as a function of composition and annaling conditions.
Phase diagrams for guiding silicon thin film deposition in photovoltaics applications as derived by real time spectroscopic ellipsometry
TL;DR: In this paper, the authors used real-time spectroscopic ellipsometry measurements of the evolution of the microstructural and optical properties of hydrogenated silicon (Si:H) films during growth to develop deposition phase diagrams.
References
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Book
Ellipsometry and polarized light
TL;DR: In this article, the polarization of light waves and propagation of polarized light through polarizing optical systems are discussed. But the authors focus on the application of ellipsometry in the field of measurement in ellipsometer systems.
Journal ArticleDOI
A Variational Approach to the Theory of the Effective Magnetic Permeability of Multiphase Materials
Z. Hashin,S. Shtrikman +1 more
TL;DR: In this article, the authors established and applied variational theorems for the derivation of bounds for the effective magnetic permeability of macroscopically homogeneous and isotropic multiphase materials.
Journal ArticleDOI
Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
TL;DR: In this article, Bruggeman and Maxwell Garnett showed that the dielectric properties of microscopically rough layers of thicknesses 100-500 \AA{}A are accurately modeled in the effective medium approximation.