Journal ArticleDOI
Optical properties of thin films
TLDR
In this article, the connection between microstructure and absolute limits to the allowed values of the dielectric response of two-phase composites is reviewed and a solution of the Clausius-Mossotti problem is developed from basic principles.About:
This article is published in Thin Solid Films.The article was published on 1982-03-19. It has received 1433 citations till now. The article focuses on the topics: Surface roughness & Isotropy.read more
Citations
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Nanoindentation studies of multilayer amorphous carbon films
TL;DR: In this paper, the mechanical properties of multilayer amorphous carbon thin films, consisting of sequential sp3-and sp2-rich layers developed on c-Si, were investigated by nanoindentation.
Journal ArticleDOI
Optical Properties of Responsive Hybrid Au@Polymer Nanoparticles
TL;DR: The most important results of the present study are that the LSPR always shifts to lower energies upon polymer collapse (in agreement with experimental results), and that the red shift expected due to increasing polymer density always overcomes the blue shift expected from decreasing layer thickness.
Journal ArticleDOI
Optical constants and thickness determination of very thin amorphous semiconductor films
TL;DR: In this article, the optical constants and thickness of very thin semiconductor and dielectric films are retrieved from transmittance data. But the method is limited to the case of amorphous silicon films.
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Surface‐roughness and grain‐boundary effects on the optical properties of low‐pressure chemical‐vapor‐deposited silicon thin films by spectroscopic ellipsometry
TL;DR: In this paper, the surface roughness and the microstructure of polycrystalline silicon thin films were investigated by combining the theory of Ohlidal and Lukes with the Bruggeman effective medium approximation.
Journal ArticleDOI
Ultra-low reflection porous silicon nanowires for solar cell applications
TL;DR: In this paper, high density vertically aligned Porous Silicon NanoWires (PSiNWs) were fabricated on silicon substrate using metal assisted chemical etching process and a linear dependency of nanowire length to the etching time was obtained and the change in the growth rate of the nano-wires by increasing etching durations was shown.
References
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Ellipsometry and polarized light
TL;DR: In this article, the polarization of light waves and propagation of polarized light through polarizing optical systems are discussed. But the authors focus on the application of ellipsometry in the field of measurement in ellipsometer systems.
Journal ArticleDOI
A Variational Approach to the Theory of the Effective Magnetic Permeability of Multiphase Materials
Z. Hashin,S. Shtrikman +1 more
TL;DR: In this article, the authors established and applied variational theorems for the derivation of bounds for the effective magnetic permeability of macroscopically homogeneous and isotropic multiphase materials.
Journal ArticleDOI
Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
TL;DR: In this article, Bruggeman and Maxwell Garnett showed that the dielectric properties of microscopically rough layers of thicknesses 100-500 \AA{}A are accurately modeled in the effective medium approximation.