Journal ArticleDOI
Optical properties of thin films
TLDR
In this article, the connection between microstructure and absolute limits to the allowed values of the dielectric response of two-phase composites is reviewed and a solution of the Clausius-Mossotti problem is developed from basic principles.About:
This article is published in Thin Solid Films.The article was published on 1982-03-19. It has received 1433 citations till now. The article focuses on the topics: Surface roughness & Isotropy.read more
Citations
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Journal ArticleDOI
Real-Time Monitoring of Morphology and Optical Properties during Sputter Deposition for Tailoring Metal-Polymer Interfaces.
Matthias Schwartzkopf,Gonzalo Santoro,Calvin J. Brett,André Rothkirch,Oleksandr Polonskyi,Alexander Hinz,Ezzeldin Metwalli,Yuan Yao,Thomas Strunskus,Franz Faupel,Peter Müller-Buschbaum,Stephan V. Roth +11 more
TL;DR: This study permits a better understanding of the growth kinetics of gold clusters and their self-organization into complex nanostructures on polymer substrates and opens up the opportunity to improve nanofabrication and tailoring of metal-polymer nanostructure for optoelectronic applications, organic photovoltaics, and plasmonic-enhanced technologies.
Journal ArticleDOI
Application of ellipsometry to crystal growth by organometallic molecular beam epitaxy
TL;DR: In this article, the first use of ellipsometry as a real-time monitor of III-V semiconductor crystal growth by molecular beam epitaxy was reported, specifically growth of GaAs and AlGaAs from arsine, triethylgallium, and triethylaluminum sources.
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Spectroscopic ellipsometry: A new tool for nondestructive depth profiling and characterization of interfaces
TL;DR: The ability of spectroscopic ellipsometry to analyze the multilayer surface structure of an implanted semiconductor with 1-2 A resolution has been demonstrated as mentioned in this paper, which can yield information nondestructively and in a nonperturbing manner: (i) on the depth profile of multi-layer structures; (ii) quantitative information on the thicknesses of each layer (within 90% confidence limits); (iii) the structure (whether crystalline or amorphous) as well as the degree of crystallinity in the region; (iv) characterize the oxide
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In situ spectroscopic ellipsometry study of the growth of microcrystalline silicon
TL;DR: In this paper, spectroscopic ellipsometry (SE) was used to determine dielectric functions of glow-discharge-produced microcrystalline silicon films (μc•Si).
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Angular selective window coatings: theory and experiments
TL;DR: In this paper, the angular selectivity of anisotropic thin films is studied and the theoretical basis for modelling the optical properties is presented, comprising rigorous bounds on the dielectric function, effective medium theories pertinent to different micro-geometries and equations for treating the optics of thin films.
References
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Ellipsometry and polarized light
TL;DR: In this article, the polarization of light waves and propagation of polarized light through polarizing optical systems are discussed. But the authors focus on the application of ellipsometry in the field of measurement in ellipsometer systems.
Journal ArticleDOI
A Variational Approach to the Theory of the Effective Magnetic Permeability of Multiphase Materials
Z. Hashin,S. Shtrikman +1 more
TL;DR: In this article, the authors established and applied variational theorems for the derivation of bounds for the effective magnetic permeability of macroscopically homogeneous and isotropic multiphase materials.
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Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
TL;DR: In this article, Bruggeman and Maxwell Garnett showed that the dielectric properties of microscopically rough layers of thicknesses 100-500 \AA{}A are accurately modeled in the effective medium approximation.