Journal ArticleDOI
Optical properties of thin films
TLDR
In this article, the connection between microstructure and absolute limits to the allowed values of the dielectric response of two-phase composites is reviewed and a solution of the Clausius-Mossotti problem is developed from basic principles.About:
This article is published in Thin Solid Films.The article was published on 1982-03-19. It has received 1433 citations till now. The article focuses on the topics: Surface roughness & Isotropy.read more
Citations
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Journal ArticleDOI
Evanescent wave optical micro-sensor based on chalcogenide glass
Joël Charrier,Marie-Laure Brandily,Marie-Laure Brandily,Hervé Lhermite,Karine Michel,Bruno Bureau,Frédéric Verger,Virginie Nazabal +7 more
TL;DR: In this paper, an optical chalcogenide micro-sensor was developed on oxidized silicon substrate for evanescent wave detection in near-infrared spectral domain.
Journal ArticleDOI
Low temperature plasma deposition of silicon nitride from silane and nitrogen plasmas
TL;DR: In this paper, the plasma enhanced chemical vapor deposition of silicon nitride films from SiH4 and N2 gases was investigated below 450 K in a helical resonator plasma reactor using in situ spectroscopic ellipsometry and attenuated total reflection Fourier transform infrared spectroscopy.
Journal ArticleDOI
Modified Envelope Method for Obtaining Optical Properties of Weakly Absorbing Thin Films and Its Application to Thin Films of Pb(Zr,Ti)O3 Solid Solutions
Chien H. Peng,Seshu B. Desu +1 more
TL;DR: In this paper, a modified envelope method, which includes the consideration of the light intensity loss from the back surface of the substrate, was developed and shown to be a simple and convenient tool for obtaining the optical properties and the thickness of the film by using the transmission spectra alone in the medium and weak absorption regions.
Journal ArticleDOI
Nanoparticles of TiO2 and VO2 in dielectric media: Conditions for low optical scattering, and comparison between effective medium and four-flux theories
Katri Laaksonen,Shuyi Li,Sakari R. Puisto,Niko K. J. Rostedt,Tapio Ala-Nissila,Tapio Ala-Nissila,Claes-Göran Granqvist,Risto M. Nieminen,Gunnar A. Niklasson +8 more
TL;DR: In this paper, the spectral transmittance and reflectance for nanoparticles of titanium dioxide and vanadium dioxide with radii between 5 and 100 nm embedded in transparent dielectric media were calculated.
Journal ArticleDOI
Electronic Polarizability as the Fundamental Variable in the Dielectric Properties of Two-Dimensional Materials
Tian Tian,Declan Scullion,Dale Hughes,Lu Hua Li,Chih-Jen Shih,Jonathan N. Coleman,Manish Chhowalla,Elton J. G. Santos +7 more
TL;DR: This work reveals a long-sought universal formalism where electronic, geometrical and dielectric properties are intrinsically correlated through the polarizability opening the door to probe quantities yet not directly measurable including the real covalent thickness of a layer.
References
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Book
Ellipsometry and polarized light
TL;DR: In this article, the polarization of light waves and propagation of polarized light through polarizing optical systems are discussed. But the authors focus on the application of ellipsometry in the field of measurement in ellipsometer systems.
Journal ArticleDOI
A Variational Approach to the Theory of the Effective Magnetic Permeability of Multiphase Materials
Z. Hashin,S. Shtrikman +1 more
TL;DR: In this article, the authors established and applied variational theorems for the derivation of bounds for the effective magnetic permeability of macroscopically homogeneous and isotropic multiphase materials.
Journal ArticleDOI
Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
TL;DR: In this article, Bruggeman and Maxwell Garnett showed that the dielectric properties of microscopically rough layers of thicknesses 100-500 \AA{}A are accurately modeled in the effective medium approximation.