Journal ArticleDOI
Optical properties of thin films
TLDR
In this article, the connection between microstructure and absolute limits to the allowed values of the dielectric response of two-phase composites is reviewed and a solution of the Clausius-Mossotti problem is developed from basic principles.About:
This article is published in Thin Solid Films.The article was published on 1982-03-19. It has received 1433 citations till now. The article focuses on the topics: Surface roughness & Isotropy.read more
Citations
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Journal ArticleDOI
Improvement of secondary electron emission property of MgO protective layer for an alternating current plasma display panel by addition of TiO2
TL;DR: In this paper, an e-beam evaporation method was used to prep Mg 2−2 x Ti x O 2 films to be used as possible substitutes for the conventional MgO protective layer.
Journal Article
Optical properties of chemical bath deposited nickel oxide (NiO) thin films
TL;DR: In this article, a thin film of NiO was deposited on glass slide from aqueous solutions of nickel chloride, and ammonia in which ammonia was employed as complexing agents in the presence of hydroxyl solution.
Journal ArticleDOI
Atomic hydrogen interactions with amorphous carbon thin films
TL;DR: In this paper, the atomic-scale interactions of H atoms with hydrogenated amorphous carbon (a-C:H) films were identified using molecular dynamics simulations and experiments based on surface characterization tools.
Journal ArticleDOI
The effect of oxidation on physical properties of porous silicon layers for optical applications
Parasteh Pirasteh,Joël Charrier,Ali Soltani,Severine Haesaert,Lazhar Haji,Christine Godon,Nicolas Errien +6 more
TL;DR: In this article, structural and optical studies have been performed to understand the optical loss mechanisms in porous silicon based waveguides, and the refractive index was measured and compared to that determined by the Bruggeman model.
Journal ArticleDOI
New approach in the monitoring and characterization of titanium nitride thin films
TL;DR: In situ and ex situ spectroscopic ellipsometry (SE), Raman spectroscopy (RS), x-ray photo-electron spectrographs (XPS), and Auger electron spectrograms (AES) have been used to study the stoichiometry and characterize TiN x thin films deposited by magnetron sputtering at various stoichiometries as mentioned in this paper.
References
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Book
Ellipsometry and polarized light
TL;DR: In this article, the polarization of light waves and propagation of polarized light through polarizing optical systems are discussed. But the authors focus on the application of ellipsometry in the field of measurement in ellipsometer systems.
Journal ArticleDOI
A Variational Approach to the Theory of the Effective Magnetic Permeability of Multiphase Materials
Z. Hashin,S. Shtrikman +1 more
TL;DR: In this article, the authors established and applied variational theorems for the derivation of bounds for the effective magnetic permeability of macroscopically homogeneous and isotropic multiphase materials.
Journal ArticleDOI
Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
TL;DR: In this article, Bruggeman and Maxwell Garnett showed that the dielectric properties of microscopically rough layers of thicknesses 100-500 \AA{}A are accurately modeled in the effective medium approximation.