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Journal ArticleDOI

Optical properties of thin films

David E. Aspnes
- 19 Mar 1982 - 
- Vol. 89, Iss: 3, pp 249-262
TLDR
In this article, the connection between microstructure and absolute limits to the allowed values of the dielectric response of two-phase composites is reviewed and a solution of the Clausius-Mossotti problem is developed from basic principles.
About
This article is published in Thin Solid Films.The article was published on 1982-03-19. It has received 1433 citations till now. The article focuses on the topics: Surface roughness & Isotropy.

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Citations
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Journal ArticleDOI

Optical properties of SiO2/nanocrystalline Si multilayers studied using spectroscopic ellipsometry

TL;DR: In this paper, variable-angle spectroscopic ellipsometry is used to measure the pseudo-dielectric functions of as-deposited and annealed SiO2/SiOx multilayers.
Journal ArticleDOI

Characterization of Tungsten Trioxide Thin Film Deposited by Spin Coating and the Effect on Their Insertion in Liquid Crystal Cells

TL;DR: In this paper, a structural study of oxide films deposited on indium tin oxide (ITO) covered glasses has been performed to have further confirmations of the model and a better understanding of the basic mechanism underlying the rectification effect and connections with the structural and electrical properties of the films, WO3 layers have been studied before and after thermal.
Journal ArticleDOI

Effects of background gas–plume interaction in the deposition of SiNx films

TL;DR: In this article, a SiN x overlayers have been grown on quartz and single-crystal Si substrates at room temperature by ablating a Si 3 N 4 sintered target in a vacuum environment and different gas atmospheres.
Journal ArticleDOI

Quantitative determination of optical and recombination losses in thin-film photovoltaic devices based on external quantum efficiency analysis

TL;DR: In this paper, the authors developed a general analysis scheme in which the optical and recombination losses in submicron-textured solar cells are evaluated systematically from external quantum efficiency (EQE) spectra.
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Structural and interfacial properties of large area n-a-Si:H/i-a-Si:H/p-c-Si heterojunction solar cells

TL;DR: In this paper, the growth of hydrogenated amorphous silicon in a doping inversed silicon heterojunction solar cell was investigated by High Resolution Transmission Electron Microscopy (HR-TEM), Spectroscopic Ellipsometry (SE), Fourier Transform Infrared Attenuated Total Reflection spectroscopy (FTIR-ATR), and currentvoltage (I-V) measurements.
References
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Book

Classical Electrodynamics

Book

Ellipsometry and polarized light

TL;DR: In this article, the polarization of light waves and propagation of polarized light through polarizing optical systems are discussed. But the authors focus on the application of ellipsometry in the field of measurement in ellipsometer systems.
Journal ArticleDOI

A Variational Approach to the Theory of the Effective Magnetic Permeability of Multiphase Materials

TL;DR: In this article, the authors established and applied variational theorems for the derivation of bounds for the effective magnetic permeability of macroscopically homogeneous and isotropic multiphase materials.
Journal ArticleDOI

Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry

TL;DR: In this article, Bruggeman and Maxwell Garnett showed that the dielectric properties of microscopically rough layers of thicknesses 100-500 \AA{}A are accurately modeled in the effective medium approximation.
Book

Theory of electrons