Journal ArticleDOI
Optical properties of thin films
TLDR
In this article, the connection between microstructure and absolute limits to the allowed values of the dielectric response of two-phase composites is reviewed and a solution of the Clausius-Mossotti problem is developed from basic principles.About:
This article is published in Thin Solid Films.The article was published on 1982-03-19. It has received 1433 citations till now. The article focuses on the topics: Surface roughness & Isotropy.read more
Citations
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Studies of adsorption at interfaces by optical techniques: Ellipsometry, second harmonic generation and sum-frequency generation
TL;DR: Optical techniques play an increasingly important role in the characterisation of thin films and liquid interfaces as discussed by the authors, and the classical technique of ellipsometry continues to evolve through improvements in instrumentation (particularly in IR) and interpretation.
Journal ArticleDOI
Effects of processing conditions on the growth of nanocrystalline diamond thin films: real time spectroscopic ellipsometry studies
Byungyou Hong,Joungchel Lee,Robert W. Collins,Yalei Kuang,W. Drawl,Russell Messier,Tien T. Tsong,Y. E. Strausser +7 more
TL;DR: In this paper, the authors applied real-time spectroscopic ellipsometry to characterize the growth of diamond nanocrystalline films on Si substrates by microwave plasma-enhanced chemical vapor deposition.
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Optical rib waveguides based on sol-gel derived silica–titania films
TL;DR: In this article, the theoretical analysis of rib channel waveguides as well as the results of experimental research on slab and single mode rib channels were presented, where the waveguide films were selectively masked with a photoresist.
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Total Internal Reflection Sum-Frequency Spectroscopy: A Strategy for Studying Molecular Adsorption on Metal Surfaces
TL;DR: In this article, total internal reflection sum-frequency spectroscopy (TIR−SFS) was used to detect molecules adsorbed on ultrathin gold films (≤10 nm) deposited on a sapphire prism.
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Microcrystalline silicon thin films studied using spectroscopic ellipsometry
TL;DR: Suzuki et al. as discussed by the authors used spectroscopic ellipsometry to characterize four different microcrystalline silicon (μc-Si) films, which were fabricated by crystallizing a-Si:H films predeposited on glass substrates using solid phase crystallization (SPC), excimer laser annealing (ELA), Ni induced silicide-mediated (Ni-SMC), and field enhanced silicide mediated (FESMC) method, respectively.
References
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Ellipsometry and polarized light
TL;DR: In this article, the polarization of light waves and propagation of polarized light through polarizing optical systems are discussed. But the authors focus on the application of ellipsometry in the field of measurement in ellipsometer systems.
Journal ArticleDOI
A Variational Approach to the Theory of the Effective Magnetic Permeability of Multiphase Materials
Z. Hashin,S. Shtrikman +1 more
TL;DR: In this article, the authors established and applied variational theorems for the derivation of bounds for the effective magnetic permeability of macroscopically homogeneous and isotropic multiphase materials.
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Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
TL;DR: In this article, Bruggeman and Maxwell Garnett showed that the dielectric properties of microscopically rough layers of thicknesses 100-500 \AA{}A are accurately modeled in the effective medium approximation.