Journal ArticleDOI
Optical properties of thin films
TLDR
In this article, the connection between microstructure and absolute limits to the allowed values of the dielectric response of two-phase composites is reviewed and a solution of the Clausius-Mossotti problem is developed from basic principles.About:
This article is published in Thin Solid Films.The article was published on 1982-03-19. It has received 1433 citations till now. The article focuses on the topics: Surface roughness & Isotropy.read more
Citations
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Journal ArticleDOI
Optical study of Erbium-doped-porous silicon based planar waveguides
Adel Najar,H. Ajlani,Joël Charrier,Nathalie Lorrain,Severine Haesaert,Mehrezi Oueslati,Lazhar Haji +6 more
TL;DR: In this article, planar waveguides were formed from porous silicon layers obtained on P+ substrates and were then doped by erbium using an electrochemical method.
Journal ArticleDOI
Functionalization control of porous silicon optical structures using reflectance spectra modeling for biosensing applications
TL;DR: In this article, the volume fraction of the biomolecules attached to the internal pore surface is determined by modeling and experimental reflectance spectra of porous silicon single layers at different steps of functionalization and protein grafting.
Journal ArticleDOI
Optical Properties of Evolutionary Grown Layers of Carbon Nanowalls Analyzed by Spectroscopic Ellipsometry
TL;DR: In this paper, carbon nanowalls (CNWs), vertically standing graphene sheets, grown by the radical injection plasma-enhanced chemical vapor deposition system were analyzed by spectroscopic ellipsometry.
Journal ArticleDOI
Optics of textured amorphous silicon surfaces
TL;DR: In this article, the authors performed real-time Stokes vector spectroscopy (also called polarimetry) during the preparation of hydrogenated amorphous silicon (a-Si:H) p-i−n solar cells on textured tin-oxide (SnO2) surfaces.
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A spectroscopic immersion ellipsometry study of SiO2-Si interface roughness for electron cyclotron resonance plasma and thermally oxidized Si surfaces
TL;DR: In this paper, spectroscopic immersion ellipsometry (SIE) was employed for the study of SiO 2 -Si interface roughness for electron cyclotron resonance (ECR) plasma and thermally oxidized Si surfaces.
References
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Book
Ellipsometry and polarized light
TL;DR: In this article, the polarization of light waves and propagation of polarized light through polarizing optical systems are discussed. But the authors focus on the application of ellipsometry in the field of measurement in ellipsometer systems.
Journal ArticleDOI
A Variational Approach to the Theory of the Effective Magnetic Permeability of Multiphase Materials
Z. Hashin,S. Shtrikman +1 more
TL;DR: In this article, the authors established and applied variational theorems for the derivation of bounds for the effective magnetic permeability of macroscopically homogeneous and isotropic multiphase materials.
Journal ArticleDOI
Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
TL;DR: In this article, Bruggeman and Maxwell Garnett showed that the dielectric properties of microscopically rough layers of thicknesses 100-500 \AA{}A are accurately modeled in the effective medium approximation.