Journal ArticleDOI
Optical properties of thin films
TLDR
In this article, the connection between microstructure and absolute limits to the allowed values of the dielectric response of two-phase composites is reviewed and a solution of the Clausius-Mossotti problem is developed from basic principles.About:
This article is published in Thin Solid Films.The article was published on 1982-03-19. It has received 1433 citations till now. The article focuses on the topics: Surface roughness & Isotropy.read more
Citations
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Journal ArticleDOI
Adsorption of surfactants in porous silicon films
TL;DR: In this article, a simple two-layer optical model was used to obtain the effective refractive indices for the porous silicon films in different ambient media, and the model agreed well with the experimental observations.
Journal ArticleDOI
Optical and microstructural properties of neutron irradiated RF- sputtered amorphous alumina thin films
I.O. Olarinoye,F. O. Ogundare +1 more
TL;DR: In this article, a stoichiometric amorphous aluminium oxide thin films were exposed to varying thermal neutron fluence ranging from 6 −×−1012−neutron/cm2 to 4 −× −1013−n · cm2 and they were investigated using X-ray diffraction, atomic force microscopy, and the UV-vis spectrophotometric analysis respectively.
Journal ArticleDOI
Optical response of composite plasma polymer/metal films in the effective medium approach☆
TL;DR: In this paper, a chlorotrifluoroethylene monomer and gold were used as starting materials for the deposition of composite films by simultaneous plasma polymerization and magnetron sputtering in an rf glow discharge.
Journal ArticleDOI
Electrical and optical properties of sputtered amorphous vanadium oxide thin films
TL;DR: Amorphous vanadium oxide (VOx) is a component found in composite nanocrystalline VOx thin films as discussed by the authors, and substantial fractions of amorphous material in the composite are necessary to optimize device electrical properties.
Journal ArticleDOI
Properties of GaN films deposited on Si(111) by radio-frequency-magnetron sputtering
TL;DR: In this paper, the pseudodielectric function e(E)=e1(E)+ie2(E) of the sputter-deposited GaN films has been measured by SE in the range between 1.50 and 5.00 eV at room temperature.
References
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Book
Ellipsometry and polarized light
TL;DR: In this article, the polarization of light waves and propagation of polarized light through polarizing optical systems are discussed. But the authors focus on the application of ellipsometry in the field of measurement in ellipsometer systems.
Journal ArticleDOI
A Variational Approach to the Theory of the Effective Magnetic Permeability of Multiphase Materials
Z. Hashin,S. Shtrikman +1 more
TL;DR: In this article, the authors established and applied variational theorems for the derivation of bounds for the effective magnetic permeability of macroscopically homogeneous and isotropic multiphase materials.
Journal ArticleDOI
Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
TL;DR: In this article, Bruggeman and Maxwell Garnett showed that the dielectric properties of microscopically rough layers of thicknesses 100-500 \AA{}A are accurately modeled in the effective medium approximation.