Journal ArticleDOI
Optical properties of thin films
TLDR
In this article, the connection between microstructure and absolute limits to the allowed values of the dielectric response of two-phase composites is reviewed and a solution of the Clausius-Mossotti problem is developed from basic principles.About:
This article is published in Thin Solid Films.The article was published on 1982-03-19. It has received 1433 citations till now. The article focuses on the topics: Surface roughness & Isotropy.read more
Citations
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Journal ArticleDOI
Microcrystalline structure of poly-Si films prepared by cathode-type r.f. glow discharge
TL;DR: In this article, a multilayer structure model based on the effective medium approximation was used for ellipsometric data analysis, and it was found that the crystalline fractions of the deposited films increase with the increase of power density and substrate temperature.
Journal ArticleDOI
X-ray characterization of GaN and related materials at growth temperatures–system design and measurements
Yoshikazu Takeda,Koji Ninoi,Guangxu Ju,Hajime Kamiya,Tetsuya Mizuno,Shingo Fuchi,Masao Tabuchi +6 more
TL;DR: In this article, an X-ray diffractometer of the laboratory level was used to investigate the phenomena that occur at the growth temperatures of metalorganic vapor phase epitaxy (MoVPE) growth.
Book ChapterDOI
Thermodynamic and kinetics of mixed protein/surfactant adsorption layers at liquid interfaces
Reinhard Miller,Eugene V. Aksenenko,V. Alahverdjieva,V. B. Fanierman,Csaba Kotsmar,Jürgen Krägel,Martin E. Leser,Julia Maldonado-Valderrama,Boris A. Noskov,Vincent Pradines,Cristina Stefaniu,Antonio Stocco,Rainer Wüstneck +12 more
Journal ArticleDOI
Gas-Phase Transport and Redeposition of Nano- and Micro-Particulates During Laser Cleaning from Solid Substrates
TL;DR: Theoretical modeling and experimental studies were performed to investigate basic processes underlying transport of model submicron spherical particles in still air and thin liquid layers of variable thickness after their laser-assisted detachment from dry and 2-propanol-dosed Si surfaces as discussed by the authors.
Journal ArticleDOI
Immersion ellipsometry of semiconductor surfaces
Ivan Ohlídal,Milan Líbezný +1 more
TL;DR: In this article, three methods of immersion ellipsometry based on measuring the ellipsometric parameters in air and nonabsorbing liquids are used for analysing silicon, germanium and gallium arsenide single crystals covered with very thin native oxide layers under normal laboratory conditions.
References
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Book
Ellipsometry and polarized light
TL;DR: In this article, the polarization of light waves and propagation of polarized light through polarizing optical systems are discussed. But the authors focus on the application of ellipsometry in the field of measurement in ellipsometer systems.
Journal ArticleDOI
A Variational Approach to the Theory of the Effective Magnetic Permeability of Multiphase Materials
Z. Hashin,S. Shtrikman +1 more
TL;DR: In this article, the authors established and applied variational theorems for the derivation of bounds for the effective magnetic permeability of macroscopically homogeneous and isotropic multiphase materials.
Journal ArticleDOI
Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
TL;DR: In this article, Bruggeman and Maxwell Garnett showed that the dielectric properties of microscopically rough layers of thicknesses 100-500 \AA{}A are accurately modeled in the effective medium approximation.