The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale
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TLDR
In this article, the authors developed a band excitation (BE) SPM, which allows very rapid acquisition of the full frequency response at each point (i.e. transfer function) in an image and in particular enables the direct measurement of energy dissipation through the determination of the Q-factor of the cantilever-sample system.Abstract:
Mapping energy transformation pathways and dissipation on the nanoscale and understanding the role of local structure in dissipative behavior is a key challenge for imaging in areas ranging from electronics and information technologies to efficient energy production. Here we develop a family of novel scanning probe microscopy (SPM) techniques in which the cantilever is excited and the response is recorded over a band of frequencies simultaneously, rather than at a single frequency as in conventional SPMs. This band excitation (BE) SPM allows very rapid acquisition of the full frequency response at each point (i.e. transfer function) in an image and in particular enables the direct measurement of energy dissipation through the determination of the Q-factor of the cantilever–sample system. The BE method is demonstrated for force–distance and voltage spectroscopies and for magnetic dissipation imaging with sensitivity close to the thermomechanical limit. The applicability of BE for various SPMs is analyzed, and the method is expected to be universally applicable to ambient and liquid SPMs.read more
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References
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Frequency modulation detection using high‐Q cantilevers for enhanced force microscope sensitivity
TL;DR: In this article, a frequency modulation (FM) technique has been demonstrated which enhances the sensitivity of attractive mode force microscopy by an order of magnitude or more, which is made possible by operating in a moderate vacuum (<10−3 Torr).
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TL;DR: In this paper, a frequency modulation (FM) technique has been demonstrated which ennances the sensitivity of attractive mode force microscopy by an order of magnitude or more, which is made possible by operating in a moderate vacuum ( < 10 ’ Torr).
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Dynamic atomic force microscopy methods
Ricardo Garcia,Rubén Pérez +1 more
TL;DR: In this paper, the authors review the fundamentals, applications and future tendencies of dynamic atomic force microscopy (AFM) methods and present a detailed quantitative comparison between theoretical simulations and experiment.
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Energy dissipation in tapping-mode atomic force microscopy
TL;DR: In this paper, a method was presented to measure the energy dissipated by the tip-sample interaction in tapping-mode atomic force microscopy (AFM) using a 4 N/m cantilever with an initial amplitude of 25 nm tapping on a hard substrate at 74 kHz.