T
Tetsu Tanaka
Researcher at Tohoku University
Publications - 423
Citations - 11239
Tetsu Tanaka is an academic researcher from Tohoku University. The author has contributed to research in topics: Wafer & Chip. The author has an hindex of 38, co-authored 406 publications receiving 10375 citations. Previous affiliations of Tetsu Tanaka include NTT DoCoMo & Tokyo Medical and Dental University.
Papers
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Proceedings ArticleDOI
Novel local stress evaluation method in 3D IC using DRAM cell array with planar mOS capacitors
TL;DR: This study has successfully demonstrated that the local bending stress in IC chips can be two-dimensionally evaluated using the DRAM cell array with planar MOS capacitances, leading to realization of 3D IC with high reliability.
Book ChapterDOI
Development of Retinal Prosthesis Module for Fully Implantable Retinal Prosthesis
Kang-Wook Lee,Tetsu Tanaka +1 more
TL;DR: The waveforms of electrically evoked potential (EEP) elicited from the rabbit brain by the current stimulation supplied from the implanted retinal prosthesis module for the first time are recorded.
Proceedings ArticleDOI
15 ps cryogenic operation of 0.19-μm-LG n+ - p+ double-gate SOI CMOS
TL;DR: In this article, the authors demonstrated a CMOS invertor with a 15 ps propagation delay (tpd) at 77 K. This device uses n+ - p+ double-gate SOI MOSFETs with a gate length (LG) of 0.19 micrometers and a gate oxide thickness (tox) around 9 nm.
Proceedings ArticleDOI
Micro-XRD investigation of fine-pitch Cu-TSV induced thermo-mechanical stress in high-density 3D-LSI
M. Murugesan,Takafumi Fukushima,Jichoel Bea,K. W. Lee,M. Koyanagi,Y. Imai,S. Kimura,Tetsu Tanaka +7 more
TL;DR: 3D-LSI stack containing diametrically highly-scaled through-silicon-vias (TSVs) with diameter 2μm as well as conventional 20 μm-width Cu-TSVs were carefully studied for thermo-mechanical stress via micro-X-ray diffraction using synchrotron radiation at Spring-8.