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Institution

International Rectifier

CompanyWrexham, Wales [Cymru GB-CYM], United Kingdom
About: International Rectifier is a company organization based out in Wrexham, Wales [Cymru GB-CYM], United Kingdom. It is known for research contribution in the topics: Power semiconductor device & Transistor. The organization has 767 authors who have published 1624 publications receiving 27118 citations.


Papers
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Patent
27 Apr 2007
TL;DR: In this paper, a circuit for minimizing voltage inrush upon startup in a switching power converter having a switching stage including high and low switches connected at a common node, a feedback loop for maintaining a target output voltage, an output capacitor connected between an output node and the ground, an inductor connected between the common node and output node, and a control circuit having a first error amplifier for providing a first signal based on a comparison of a reference voltage and voltage provided by the feedback loop, the level switch being controlled in accordance with the first signal, wherein a large inrush current flowing
Abstract: A circuit for minimizing voltage inrush upon startup in a switching power converter having a switching stage including high and low switches connected at a common node, a feedback loop for maintaining a target output voltage, an output capacitor connected between an output node and the ground, an inductor connected between the common node and the output node, and a control circuit having a first error amplifier for providing a first signal based on a comparison of a reference voltage and voltage provided by the feedback loop, the control circuit including a level switch connected between the ground and the common node, the level switch being controlled in accordance with the first signal, wherein a large inrush current flowing into the output capacitor when the circuit is starting up is minimized

8 citations

Patent
09 Sep 2011
TL;DR: A semiconductor device package is formed of DBC in which thinned MOSgated and/or diode die are soldered to the bottom of an etched depression in the upper conductive layer as mentioned in this paper.
Abstract: A semiconductor device package is formed of DBC in which thinned MOSgated and/or diode die are soldered to the bottom of an etched depression in the upper conductive layer. A via in the insulation layer of the DBC is filled with a conductive material to form a resistive shunt. Plural packages may be formed in a DBC card and may be separated individually or in clusters. The individual packages are mounted in various arrays on a support DBC board and heat sink. Integrated circuits may be mounted on the assembly and connected to the die for control of the die conduction.

8 citations

Patent
11 Jan 2001
TL;DR: The power semiconductor module has an insulating molded housing (50) with open upper and lower sides and a peripheral frame enclosing a number of S1-S6 components, which are coupled together and to conductor terminals as discussed by the authors.
Abstract: The power semiconductor module has an insulating molded housing (50) with open upper and lower sides and a peripheral frame (60) enclosing a number of power semiconductor components (S1-S6), which are coupled together and to conductor terminals. A conductor frame has a number of coplanar conductive terminal surfaces (30,31,32,33,34) with associated termination lines (U,V,W,20,21), fitting through the peripheral frame, the coplanar lower surfaces of the conductor frame terminal surfaces attached to a separate heat sink.

8 citations

Patent
19 Aug 2002
TL;DR: In this paper, a wafer having a rounded edge is thinned to 100 microns or less, producing a tapered razor like edge The edge is ground to blunt it and reduce danger to personnel and equipment during handling of the wafer.
Abstract: A wafer having a rounded edge is thinned to 100 microns or less, producing a tapered razor like edge The edge is ground to blunt it and reduce danger to personnel and equipment during handling of the wafer

8 citations

Patent
26 Jun 2007
TL;DR: In this article, a III-nitride semiconductor device which includes a barrier body between the gate electrode and the gate dielectric thereof is described, and the barrier body can be used to measure the gate voltage.
Abstract: A III-nitride semiconductor device which includes a barrier body between the gate electrode and the gate dielectric thereof.

8 citations


Authors

Showing all 768 results

NameH-indexPapersCitations
Robert S. Brown130124365822
Praveen Jain5962711528
Edwin L. Piner421625020
Jerry W. Johnson371093522
Steffen Rupp361574848
Kevin J. Linthicum361174334
Andrei Vescan312073308
Thomas Gehrke28812753
Pradeep Rajagopal27652282
Thomas J. Ribarich24831547
Daniel M. Kinzer23822054
Bo Yang21403331
Johan Strydom21752159
Michael A. Briere191421200
Robert Joseph Therrien19561441
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Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
20221
20201
20192
20183
20175
201611