Institution
International Rectifier
Company•Wrexham, Wales [Cymru GB-CYM], United Kingdom•
About: International Rectifier is a company organization based out in Wrexham, Wales [Cymru GB-CYM], United Kingdom. It is known for research contribution in the topics: Power semiconductor device & Transistor. The organization has 767 authors who have published 1624 publications receiving 27118 citations.
Papers published on a yearly basis
Papers
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27 Apr 2007TL;DR: In this paper, a circuit for minimizing voltage inrush upon startup in a switching power converter having a switching stage including high and low switches connected at a common node, a feedback loop for maintaining a target output voltage, an output capacitor connected between an output node and the ground, an inductor connected between the common node and output node, and a control circuit having a first error amplifier for providing a first signal based on a comparison of a reference voltage and voltage provided by the feedback loop, the level switch being controlled in accordance with the first signal, wherein a large inrush current flowing
Abstract: A circuit for minimizing voltage inrush upon startup in a switching power converter having a switching stage including high and low switches connected at a common node, a feedback loop for maintaining a target output voltage, an output capacitor connected between an output node and the ground, an inductor connected between the common node and the output node, and a control circuit having a first error amplifier for providing a first signal based on a comparison of a reference voltage and voltage provided by the feedback loop, the control circuit including a level switch connected between the ground and the common node, the level switch being controlled in accordance with the first signal, wherein a large inrush current flowing into the output capacitor when the circuit is starting up is minimized
8 citations
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09 Sep 2011TL;DR: A semiconductor device package is formed of DBC in which thinned MOSgated and/or diode die are soldered to the bottom of an etched depression in the upper conductive layer as mentioned in this paper.
Abstract: A semiconductor device package is formed of DBC in which thinned MOSgated and/or diode die are soldered to the bottom of an etched depression in the upper conductive layer. A via in the insulation layer of the DBC is filled with a conductive material to form a resistive shunt. Plural packages may be formed in a DBC card and may be separated individually or in clusters. The individual packages are mounted in various arrays on a support DBC board and heat sink. Integrated circuits may be mounted on the assembly and connected to the die for control of the die conduction.
8 citations
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11 Jan 2001TL;DR: The power semiconductor module has an insulating molded housing (50) with open upper and lower sides and a peripheral frame enclosing a number of S1-S6 components, which are coupled together and to conductor terminals as discussed by the authors.
Abstract: The power semiconductor module has an insulating molded housing (50) with open upper and lower sides and a peripheral frame (60) enclosing a number of power semiconductor components (S1-S6), which are coupled together and to conductor terminals. A conductor frame has a number of coplanar conductive terminal surfaces (30,31,32,33,34) with associated termination lines (U,V,W,20,21), fitting through the peripheral frame, the coplanar lower surfaces of the conductor frame terminal surfaces attached to a separate heat sink.
8 citations
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19 Aug 2002TL;DR: In this paper, a wafer having a rounded edge is thinned to 100 microns or less, producing a tapered razor like edge The edge is ground to blunt it and reduce danger to personnel and equipment during handling of the wafer.
Abstract: A wafer having a rounded edge is thinned to 100 microns or less, producing a tapered razor like edge The edge is ground to blunt it and reduce danger to personnel and equipment during handling of the wafer
8 citations
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26 Jun 2007TL;DR: In this article, a III-nitride semiconductor device which includes a barrier body between the gate electrode and the gate dielectric thereof is described, and the barrier body can be used to measure the gate voltage.
Abstract: A III-nitride semiconductor device which includes a barrier body between the gate electrode and the gate dielectric thereof.
8 citations
Authors
Showing all 768 results
Name | H-index | Papers | Citations |
---|---|---|---|
Robert S. Brown | 130 | 1243 | 65822 |
Praveen Jain | 59 | 627 | 11528 |
Edwin L. Piner | 42 | 162 | 5020 |
Jerry W. Johnson | 37 | 109 | 3522 |
Steffen Rupp | 36 | 157 | 4848 |
Kevin J. Linthicum | 36 | 117 | 4334 |
Andrei Vescan | 31 | 207 | 3308 |
Thomas Gehrke | 28 | 81 | 2753 |
Pradeep Rajagopal | 27 | 65 | 2282 |
Thomas J. Ribarich | 24 | 83 | 1547 |
Daniel M. Kinzer | 23 | 82 | 2054 |
Bo Yang | 21 | 40 | 3331 |
Johan Strydom | 21 | 75 | 2159 |
Michael A. Briere | 19 | 142 | 1200 |
Robert Joseph Therrien | 19 | 56 | 1441 |