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Journal ArticleDOI

Low-energy ion scattering at surfaces

TLDR
The field of low-energy ion scattering for surface interactions at metals, alloys, catalysts and semiconductors is reviewed in this article, where the basic principles, classical scattering theory, the effect of shadowing and blocking, and some of the computer simulation programs are briefly described.
About
This article is published in Surface Science Reports.The article was published on 1993-05-01. It has received 531 citations till now. The article focuses on the topics: Low-energy ion scattering & Scattering.

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Citations
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Journal ArticleDOI

Surface composition analysis by low-energy ion scattering

TL;DR: In this paper, a review of surface composition analysis by low-energy ion scattering (LEIS) is presented, where the authors summarize the present understanding of the factors that determine the ion fraction of the scattered particles in LEIS, i.e. charge exchange processes.
Journal ArticleDOI

STM study of the geometric and electronic structure of ZnO(0001)-Zn, (0001̄)-O, (101̄0), and (112̄0) surfaces

TL;DR: In this article, structural models for the different surfaces of ZnO surfaces are proposed and related to the stability and reactivity of the surfaces, based on these results, structural models are proposed.
Journal ArticleDOI

Collisions of atoms and ions with surfaces under grazing incidence

TL;DR: In this article, a detailed discussion of the scattering of fast atoms and ions from solid surfaces under a grazing angle of incidence is presented Theoretical and experimental results are used to demonstrate that collisions employing this scattering geometry provide interesting new phenomena and insights into atom-surface interactions.
Journal ArticleDOI

Interaction of slow multicharged ions with solid surfaces

TL;DR: In this paper, the main aspects of the interaction of slow (impact velocity typically below 1 a.u.) multicharged ions (MCI) with atomically clean solid surfaces of metals, semiconductors and insulators are discussed.
Journal ArticleDOI

Adsorbate structure determination on surfaces using photoelectron diffraction

TL;DR: A review of the background physics of the process and the development of the technique is described in this article, and a brief discussion of the high energy forward scattering version of the X-ray photoelectron diffraction-XPD is included, but the most of the review is concerned with the lower energy backscattering method more relevant to the determination of detailed adsorption sites on surfaces.
References
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Journal ArticleDOI

Ion impact desorption of metal atoms from -metal surfaces

TL;DR: In this paper, the surface binding energies of Ag and Au are determined as a function of Ar+ fluence using AES and RBS techniques, and they are compared with the sputtering cross-section of the substrate.
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Computer simulations of low-energy neon-ion scattering from nickel crystals

TL;DR: The model of successive single binary elastic collisions used by a computer code called ARGUS is sufficiently accurate to reproduce the salient features of energy spectra that result from ion-surface scattering for the neon on nickel system down to incidence energies of 600 eV as mentioned in this paper.
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Computer simulation of the angular dependence of backscattering of low energy noble gas ions from single crystal surfaces

TL;DR: In this paper, the intensity distributions of low energy noble gas ions backscattered from single crystal surfaces have been simulated by a computer program and compared with experiments for He+ on W(110) and for Ne+ on Ni(110).
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Scattering of low-energy Ne+ and Na+ from Cu(110): Thermal and neutralization effects

TL;DR: In this paper, the scattering of 1 keV Ne+ and Na+ from a Cu(110) surface in the temperature range from 100 K to 600 K has been investigated experimentally and by using the numerical code ARGUS.
Journal ArticleDOI

Energy loss of light ions and neutrals from surface scattering

TL;DR: In this article, the energy spectra of He scattered at grazing incidence from a clean metal surface are measured by a time-of-flight method, interpreted in terms of the dielectric response function of the metal.
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