Journal ArticleDOI
Normally-Off AlGaN/GaN/AlGaN Double Heterostructure FETs With a Thick Undoped GaN Gate Layer
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TLDR
In this paper, a double-heterostructure Al0.26Ga0.93N-based field effect transistors (DHFETs) using a 35-nm-thick undoped GaN layer underneath the gate metallization was reported.Abstract:
In this letter, we report on polarization charge engineering enabling normally-off operation for a double-heterostructure Al0.26Ga0.74N/GaN/Al0.07Ga0.93N-based field effect transistors (DHFETs) using a 35-nm-thick undoped GaN layer underneath the gate metallization. The combined effect of the negative polarization charge induced by the AlGaN back barrier and the undoped GaN gate layer ensures the total depletion of the channel, and provides a positive threshold voltage. The fabricated DHFET exhibits normally-off operation with a threshold voltage of 1.2 V, a maximum drain current density of 370 mA/mm, and a high ON/OFF current ratio of $10^{7}$ , at a gate bias of 7 V. A transistor with gate–drain distance of 6 $\mu \text{m}$ demonstrates 300 V off-state breakdown voltage.read more
Citations
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GaN Monolithic Inverter IC Using Normally-off Gate Injection Transistors
Tatsuo Morita,Hidekazu Umeda,Ayanori Ikoshi,Hisayoshi Matsuo,Jun Shimizu,Masahiro Hikita,Manabu Yanagihara,Yasuhiro Uemto,Tetsuzo Ueda,Tsuyoshi Tanaka,Daisuke Ueda +10 more
TL;DR: In this article, a GaN monolithic inverter IC on Si substrate and successful motor-drive by it for the first time was presented, taking advantage of the bi-directional operation free from the forward voltage off-set.
Journal ArticleDOI
Suppression of Current Collapse in Enhancement Mode GaN-Based HEMTs Using an AlGaN/GaN/AlGaN Double Heterostructure
TL;DR: In this paper, an enhancement mode (E-mode) AlGaN/GaN and GaN/AlGaN double heterostructure was proposed to suppress current collapse in high-electron mobility transistors.
Journal ArticleDOI
Design and simulation of a doping-less charge plasma based enhancement mode GaN MOSFET
TL;DR: In this paper, a doping-less normally OFF/enhancement mode GaN based MOSFET was designed and simulated using charge plasma concept to induce n type charge plasma in an undoped GaN film.
Journal ArticleDOI
Switching Transient Analysis and Characterization of an E-Mode B-Doped GaN-Capped AlGaN DH-HEMT with a Freewheeling Schottky Barrier Diode (SBD)
Baskaran Subramanian,Mohanbabu Anandan,Saminathan Veerappan,Murugapandiyan Panneerselvam,Mohammed Wasim,Saravana Kumar Radhakrishnan,Praveen Pechimuthu,Yogesh Kumar Verma,Subash Navaneethan Vivekanandhan,Elamurugan Raju +9 more
TL;DR: In this article, the authors presented a systematic study of Al0.23Ga0.77N/GaN/AlxGa1−xN double-heterojunction high-electron-mobility transistors (DH-HEMTs) with a boron-doped P+ GaN cap layer under the gate.
References
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Journal ArticleDOI
Two-dimensional electron gases induced by spontaneous and piezoelectric polarization charges in N- and Ga-face AlGaN/GaN heterostructures
Oliver Ambacher,Joseph A. Smart,James R. Shealy,Nils Weimann,K. Chu,M. J. Murphy,William J. Schaff,L.F. Eastman,Roman Dimitrov,L. Wittmer,Martin Stutzmann,W. Rieger,J. Hilsenbeck +12 more
TL;DR: In this article, the authors investigated the role of spontaneous and piezoelectric polarization on the carrier confinement at GaN/AlGaN and AlGaN/GaN interfaces.
Journal ArticleDOI
Gate Injection Transistor (GIT)—A Normally-Off AlGaN/GaN Power Transistor Using Conductivity Modulation
Yasuhiro Uemoto,Masahiro Hikita,Hiroaki Ueno,Hisayoshi Matsuo,Hidetoshi Ishida,Manabu Yanagihara,Tetsuzo Ueda,Tsuyoshi Tanaka,Daisuke Ueda +8 more
TL;DR: In this paper, a gate injection transistor (GIT) was proposed to increase the electron density in the channel, resulting in a dramatic increase of the drain current owing to the conductivity modulation.
Journal ArticleDOI
GaN on Si Technologies for Power Switching Devices
TL;DR: In this article, a gate injection transistor (GIT) is proposed to increase the drain current with low on-state resistance by conductivity modulation, which greatly helps in increasing the efficiency of power switching systems.
Journal ArticleDOI
p-GaN Gate HEMTs With Tungsten Gate Metal for High Threshold Voltage and Low Gate Current
In-jun Hwang,Jongseob Kim,Hyuk Soon Choi,Hyoji Choi,Jaewon Lee,Kyung Yeon Kim,Jong-Bong Park,Jae Cheol Lee,Jong-Bong Ha,Jae-joon Oh,Jai-Kwang Shin,U-In Chung +11 more
TL;DR: In this paper, the impact of gate metals on the threshold voltage and the gate current of p-GaN gate high-electron-mobility transistors (HEMTs) is investigated.
Journal ArticleDOI
600-V Normally Off ${\rm SiN}_{x}$ /AlGaN/GaN MIS-HEMT With Large Gate Swing and Low Current Collapse
TL;DR: In this paper, a 600-V normally-off SiNx/AlGaN/GaN metal-insulator-semiconductor high-electron-mobility transistor (MIS-HEMT) is reported.