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Showing papers on "Spice published in 1996"


Book
01 Jan 1996
TL;DR: Contents: Introduction: Mixed Analog-Digital Chips The MOSFET: Introduction and Qualitative View.
Abstract: Contents: Introduction: Mixed Analog-Digital Chips The MOSFET: Introduction and Qualitative View MOSFET DC Modeling MOSFET Small-Signal Modeling Technology and Available Circuit Components Layout Appendices: Additional MOS Transistor Modeling Information A Set of Benchmark Tests for Evaluating MOSFET Models for Analog Design A Sample Spice Input File.

195 citations


Book
01 Jan 1996
TL;DR: The SPICE Modeling and the Dominance of CMOS Technology and the Formalism of Model Building and the Future of Device Models for Circuit Simulation are studied.
Abstract: 1. SPICE Modeling and the Dominance of CMOS Technology. 2. SPICE Modeling and the Formalism of Model Building. 3. The Semiconductor Physics of MOS Structures. 4. A Comparison of Analytical and Numerical Results. 5. The Level 1 Model. 6. The Level 2 Model. 7. The Level 3 Model. 8. BSIM. 9. HSPICE Level 28. 10. BSIM2. 11. BSIM3. 12. MOS Model 9. 13. The Active Device Capacitance. 14. Accounting for Systematic Process Variations. 15. Circuit Level Correlation of Models and Hardware. 16. New Model Candidates. 17. The Future of Device Models for Circuit Simulation. APPENDICES. A. An Executive Summary of the Various Models. B. Channel Length and Width. C. The Final Model Equations. D. The Extracted HSPICE Level 28 Model. E. The Binned BSIM2 Model. INDEX.

191 citations


Proceedings ArticleDOI
01 Jan 1996
TL;DR: In this article, a circuit-level simulator for ESD and EOS is presented, which uses the three terminal currents obtained from a single high current I-V curve, and compared to experimental data for single devices as well as a practical output circuit.
Abstract: A circuit-level simulator for ESD and EOS is presented. Equations for modeling the high current behavior of NMOS and PMOS transistors have been developed and implemented in SPICE. A simple and practical extraction methodology for obtaining the bipolar parameters is given, which uses the three terminal currents obtained from a single high current I-V curve. Simulation results are presented and compared to experimental data for single devices as well as a practical output circuit.

146 citations


Journal ArticleDOI
TL;DR: In this article, the contribution of the p/sup -/ substrate and channel stopper to the equivalent circuits of Si-bipolar transistors and bond pads is theoretically and experimentally investigated up to very high frequencies.
Abstract: In the design of high-speed IC's, the influence of the substrate on circuit performance must be considered carefully. Therefore, in this paper the contribution of the p/sup -/ substrate and channel stopper to the equivalent circuits of Si-bipolar transistors and bond pads are theoretically and experimentally investigated up to very high frequencies. Improved equivalent substrate circuits, well suited for standard circuit simulators (e,g., SPICE), are derived and checked by numerical simulation using a new simulator (called SUSI). The validity of both the numerical simulation results and the equivalent circuits are verified by on-wafer measurements up to 20 GHz. Finally, the simulator was successfully applied to investigate noise coupling via the substrate.

103 citations


Journal ArticleDOI
TL;DR: In this article, a distributed SPICE-model for a solar cell is worked out, which is based on the I-V characteristics, the small signal impedance, and the open-circuit voltage decay measurements.
Abstract: In this paper, a distributed SPICE-model for a solar cell is worked out. Special attention is paid to the problems of nonhomogeneous current distribution and the effective series resistance. Elaborate experimental techniques have been used to determine the model parameters. They are based on the I-V characteristics, the small signal impedance, and the open-circuit voltage decay measurements. The SPICE simulation results are compared with the measured static and dynamic characteristics of a solar cell. We found satisfactory agreement concerning the static characteristics, whereas there is discrepancy in the dynamic characteristics. This is because the SPICE-model of a p-n junction diode contains only one time constant. It is found that two time constants are necessary for accurate description of the dynamic performance. The techniques and methodologies developed here are applicable to other junction diodes operating at high frequencies or under transient conditions.

70 citations


Proceedings ArticleDOI
01 Jun 1996
TL;DR: An algorithm for the estimation of power in static CMOS digital circuits using a stochastic approach that can be used to estimate the power of reasonably large digital circuits in a very short time, due to its hierarchical nature.
Abstract: This paper presents an algorithm for the estimation of power in static CMOS digital circuits using a stochastic approach. The salient feature of this approach is that it can be used to estimate the power of reasonably large digital circuits in a very short time, due to its hierarchical nature. Here, the given circuit is first partitioned into smaller sub-circuits. Then, the sub-circuits are modeled using state transition diagrams (stds), and the steady-state probabilities associated with the various states are computed by treating them as irreducible Markov chains. Finally, the energy associated with each sub-circuit is computed, and the total energy of the circuit is obtained by summing up the energies of its constituent sub-circuits. In the proposed hierarchical approach, the energies associated with various edges in a subcircuit are calculated only once using SPICE and these values are used several times; this results in large savings in computation time. Another advantage of the proposed approach is that we can accommodate switching activities at the transistor level and not necessarily at gate or higher levels. Experimental results show that the estimated power is in close agreement with the actual power obtained from exhaustive SPICE simulations, but the computation time required by the proposed approach is orders of magnitude less than that of SPICE.

62 citations


Journal ArticleDOI
TL;DR: In this article, a current controlled oscillator based on translinear current conveyors is presented, which uses two CCCII+s and two grounded capacitors to control the frequency of the oscillator.
Abstract: A current controlled oscillator based on translinear current conveyors is presented. The oscillation frequency can be varied proportionally to the bias current. The oscillator uses two CCCII+s, and two grounded capacitors. SPICE simulation results agree with the theory.

55 citations


Journal ArticleDOI
TL;DR: In this paper, a circuit model for lossy multiconductor transmission lines (MTLs) is proposed, which is suitable for implementation in modern SPICE simulators, as well as in any simulator supporting differential operators.
Abstract: This paper proposes a circuit model for lossy multiconductor transmission lines (MTLs) suitable for implementation in modern SPICE simulators, as well as in any simulator supporting differential operators. The model includes the effects of a uniform or nonuniform disturbing field illuminating the line and is especially devised for the transient simulation of electrically long wideband interconnects with frequency dependent per-unit-length parameters. The MTL is characterized by its transient matched scattering responses, which are computed including both dc and skin losses by means of a specific algorithm for the inversion of the Laplace transform. The line characteristics are then represented in terms of differential operators and ideal delays to improve the numerical efficiency and to simplify the coding of the model in existing simulators. The model can be successfully applied to many kinds of interconnects ranging from micrometric high-resistivity metallizations to low-loss PCBs and cables, and can be considered a practical extension of the widely appreciated lossless MTL SPICE model, which maintains the simplicity and efficiency.

53 citations


Journal ArticleDOI
TL;DR: In this paper, a new expression to estimate SSN in CMOS circuits that includes the velocity saturation effects seen in the short-channel MOSFETs is derived, and SPICE Level 3 simulation results show that the formula predicts the SSN more accurately as compared to existing approaches for submicron processes even at reduced supply voltages.
Abstract: Simultaneous switching noise (SSN) on power supply lines is caused by the large switching transient currents flowing through parasitic inductances at the chip-package-pin interface. A new expression to estimate SSN in CMOS circuits that includes the velocity saturation effects seen in the short-channel MOSFETs is derived. SPICE Level 3 simulation results show that the formula predicts the SSN more accurately as compared to existing approaches for submicron processes even at reduced supply voltages.

50 citations


Journal ArticleDOI
TL;DR: In this paper, the authors describe some design aspects in the implementation of CMOS current comparators, including offset and charge-injection compensations, and some basic topologies for compensated comparators are presented and compared by SPICE simulations.
Abstract: The paper describes some design aspects in the implementation of CMOS current comparators. More specifically, techniques for offset and charge-injection compensations are discussed in detail, and some basic topologies for compensated current comparators are presented and compared by SPICE simulations. Moreover, a novel compensated fully differential current comparator is proposed which achieves a very high performance. It provides a sensitivity as low as 20 nA and a switching time better than 30 ns with a 0.5 /spl mu/A input step current while dissipating 45 /spl mu/W.

50 citations


Journal ArticleDOI
TL;DR: In this paper, a sensitive micro-Pirani vacuum sensor has been fabricated with effective schemes of ambient-temperature compensation and stabilization, it is capable of measuring vacuum pressure linearly from 1 torr down to 10 −7 torr, a three orders of magnitude improvement in resolution over conventional gauges.
Abstract: A sensitive micro-Pirani vacuum sensor has been fabricated. With effective schemes of ambient-temperature compensation and stabilization, it is capable of measuring vacuum pressure linearly from 1 torr down to 10 −7 torr, a three orders-of-magnitude improvement in resolution over conventional gauges. A special electrothermal SPICE model, complementary to the conventional analog representation of thermal parameters, is also proposed. It allows a high-level sensor-circuit integrated simulation based on the most fundamental principle and thermal variables. Good agreement between the measured data obtained from a constant-temperature readout circuit and the simulation result is demonstrated.

Proceedings ArticleDOI
01 Dec 1996
TL;DR: A new statistical parameter extraction methodology which translates actual process variations into SPICE model parameter variations is presented and excellent, overall I-V curve fit for multiple device geometries is achieved.
Abstract: A new statistical parameter extraction methodology which translates actual process variations into SPICE model parameter variations is presented. This methodology uses E-T data to extract SPICE model parameters and guarantees that its extraction results match measured variations. We have applied this methodology to an industrial 0.5 /spl mu/m process. Excellent, overall I-V curve fit for multiple device geometries is achieved. A compact statistical circuit design technology that improves upon the typical/worst/best case methodology is also presented.

Journal ArticleDOI
TL;DR: In this article, a CMOS class-AB current mirror for high-precision current-mode analog-signal processing elements is described, which reduces the offset error caused by device mismatch, nonlinearity distortion and power consumption.
Abstract: CMOS class-AB current mirrors for high-precision current-mode analog-signal-processing elements are described. The class-AB configuration allows us to reduce the offset error caused by device mismatch, the nonlinearity distortion, and power consumption. The offset error due to the device mismatch is greatly reduced by the reduction of the bias current. The class-AB current-mirror has less sensitivity to the mismatch since the bias current relative to the signal current can be reduced. The excellent precision is confirmed by Monte Carlo simulation and SPICE based on 1 /spl mu/m CMOS LSI parameters.

Proceedings ArticleDOI
11 Aug 1996
TL;DR: In this article, an improved and simplified formulation for a solar array currentvoltage model is given for a simplified numerical solution, which is practical for SPICE simulation of orbital-scale electrical power systems.
Abstract: An improved and simplified formulation is given for a solar array current-voltage model. This model curve matches a specified maximum power point (i,v) specification, in addition to the open-circuit and short-circuit specifications. The improved model has a simplified numerical solution, which is practical for SPICE simulation of orbital-scale electrical power systems. This paper presents the mathematical development of the solar array model solution, and the form of the necessary Newton/Raphson equations. The iterative nonlinear solution is then realized in a SPICE model of the solar array, which is then demonstrated in an orbital-time-scale satellite power system simulation.

Journal ArticleDOI
TL;DR: The proposed method can perform very fast bridging fault simulation yet with SPICE accuracy, and experimental results on ISCAS85 benchmarks are promising.
Abstract: This paper presents an alternative modeling and simulation method for CMOS bridging faults. The significance of the method is the introduction of a set of generic-bridge tables which characterize the bridged outputs for each bridge and a set of generic-cell tables which characterize how each cell propagates a logically undefined input. These two sets of tables are derived dynamically for a specific design by using a SPICE circuit simulator. Then they can be used by any logic fault simulator to simulate bridging faults. In this way, the proposed method can perform very fast bridging fault simulation yet with SPICE accuracy. The paper shows how these two sets of tables are derived and used in a parallel pattern fault simulator. Experimental results on ISCAS85 benchmarks are promising.

Proceedings ArticleDOI
12 May 1996
TL;DR: A suite of software tools for parameterized layout synthesis and SPICE simulation for surface-micromachined micro-electrical-mechanical systems (MEMS) is presented in this article.
Abstract: A suite of software tools which implements parameterized layout synthesis and SPICE simulation for surface-micromachined micro-electrical-mechanical systems (MEMS) is presented. These tools and techniques are demonstrated by using the design of a MEMS linear resonator as an example, and the various stages of this design are examined, including the generation of the circuit layout from performance specifications, the simulation of the devices, and the testing of actual fabricated resonators.

Journal ArticleDOI
TL;DR: In this article, the authors give the reason the original early effect approximations were made, present a new way to plot data to best show the Early effect, and detail a new, consistent, coupled method to determine forward and reverse Early voltages.
Abstract: The approximations made in the Early effect formulation of the SPICE Gummel-Poon bipolar junction transistor (BJT) model were reasonable when the model was first developed but introduce unnecessary inaccuracies when modeling the output conductance of modern BJTs. In this paper, we give the reason the original approximations were made, present a new way to plot data to best show the Early effect, and detail a new, consistent, coupled method to determine forward and reverse Early voltages.

Proceedings ArticleDOI
02 Dec 1996
TL;DR: The findings reported in this paper provide guidance for future studies of interrater agreement in the SPICE trials and also indicate some potential issues that need to be considered within the prospective standard.
Abstract: The international SPICE Project intends to deliver an ISO standard on software process assessment. This project is unique in software engineering standards in that there is a set of empirical trials, the objectives of which are to evaluate the prospective standard and provide feedback before standardization. One of the enduring issues being evaluated during the trials is the reliability of assessments based on SPICE. One element of reliability is the extent to which different teams assessing the same processes produce similar ratings when presented with the same evidence. We present some preliminary results from two assessments conducted during the SPICE trials. In each of these assessments two independent teams performed the same ratings. The results indicate that in general there is at least moderate agreement between the two teams in both cases. When we take into account the severity of disagreement then the extent of agreement between the two teams is almost perfect. Also, our results indicated that interrater agreement is not the same for different SPICE processes. The findings reported in this paper provide guidance for future studies of interrater agreement in the SPICE trials and also indicate some potential issues that need to be considered within the prospective standard.

Proceedings ArticleDOI
12 Aug 1996
TL;DR: A low-power SRAM design based on the theory of energy recovery that reduces the dissipation associated with write operations while operating at high speed is presented.
Abstract: We present a low-power SRAM design based on the theory of energy recovery that reduces the dissipation associated with write operations while operating at high speed. The energy-recovery SRAM was evaluated through SPICE simulations and compared with a standard design. Simulation results of a 256 × 256 memory configuration indicate that, for successive write operations, energy saving for the different SRAM functions vary from 59% to 76% at 200 MHz operating frequency compared to the conventional design.

Journal ArticleDOI
TL;DR: In this article, a current mirror is proposed as a suitable structure for the characterization of layout dependent thermal coupling between MOSFETs, and it is demonstrated that thermal coupling can be observed in a 2 /spl mu/m SOI CMOS technology, with devices separated by as much as 20 /spl µ/m.
Abstract: A current mirror is proposed as a suitable structure for the characterization of layout dependent thermal coupling between MOSFETs. Using current and voltage measurements, and compensating for series resistance effects, very small changes in local device temperature can be made visible. For the first time it is demonstrated that thermal coupling can be observed in a 2 /spl mu/m SOI CMOS technology, with devices separated by as much as 20 /spl mu/m. Measurements were verified by electro-thermal SPICE simulations, using a simple lumped model to express thermal coupling. The observations reinforce the need for accurate circuit level models, including self heating and thermal coupling effects, for analogue applications in VLSI SOI CMOS technologies.

Book ChapterDOI
22 Sep 1996
TL;DR: A standard optimizer, a Monte Carlo scheme and a method based on Genetic Algorithms combined with very accurate SPICE simulations to automatically optimize transistor sizes of three different digital CMOS circuits found to be more stable for larger circuits.
Abstract: The performance of a CMOS circuit depends heavily on its transistor sizes. We have tested a standard optimizer, a Monte Carlo scheme and a method based on Genetic Algorithms combined with very accurate SPICE simulations to automatically optimize transistor sizes of three different digital CMOS circuits. While the standard optimizer and the Monte Carlo scheme are advantageous for small circuits, the method based on Genetic Algorithms was found to be more stable for larger circuits.

Proceedings ArticleDOI
23 Jun 1996
TL;DR: In this article, a new power diode model is developed and implemented as a PSPICE subcircuit, which takes into account emitter recombination in the highly doped end regions, conductivity modulation in the base and the moving-boundaries effect during reverse-recovery.
Abstract: A new power diode model is developed and implemented as a PSPICE subcircuit. The starting point of the new model is a continued-fraction expression in the Laplace domain of the carrier distribution in the base region. By truncating the continued-fraction expansion, lumped RC representations of the base region are easily obtained. In the time domain, this approach approximates of the exact behavior of the carrier distribution with a sum of decaying exponentials, obtained by matching the moments of the exact carrier distribution. The proposed model takes into account emitter recombination in the highly doped end regions, conductivity modulation in the base and the moving-boundaries effect during reverse-recovery, showing good convergence properties and fast simulation times. Comparisons between the results of the SPICE models and numerical device simulations are presented.

Journal ArticleDOI
TL;DR: In this article, the authors describe a novel current mirror for low voltage and low frequency application, which uses an op amp with only two MOS transistors operating in the weak inversion region.
Abstract: The authors describe a novel current mirror for low voltage and low frequency application, which uses an op amp with only two MOS transistors operating in the weak inversion region. The advantages of the circuit are low voltage operation, small chip area, high output resistance and no bias current (voltage). The proposed circuit is confirmed by SPICE simulation.

Proceedings ArticleDOI
10 Nov 1996
TL;DR: Experimental results on a set of ISCAS'85 benchmark circuits show that the power estimation provides within 7% error of SPICE simulation on average while the CPU time consumed is more than two orders of magnitude less.
Abstract: In this paper, we propose power consumption models for complex gates and transmission gates, which are extended from the model of basic gates proposed in Lin et al., (1994). We also describe an accurate power characterization method for CMOS standard cell libraries which accounts for the effects of input slew rate, output loading, and logic state dependencies. The characterization methodology separates the power consumption of a cell into three components, e.g., capacitive feedthrough power, short-circuit power, and dynamic power. For each component, power equation is derived from SPICE simulation results where the netlist is extracted from cell's layout. Experimental results on a set of ISCAS'85 benchmark circuits show that the power estimation based on our power modeling and characterization provides within 7% error of SPICE simulation on average while the CPU time consumed is more than two orders of magnitude less.

Proceedings ArticleDOI
23 Jun 1996
TL;DR: The case of SEPIC with uncoupled inductors is treated, which is compatible with SPICE and other modern electronic circuit simulators and can be used to run DC, AC and TRAN analyses.
Abstract: An average model of SEPIC power converters operating in continuous current mode (CCM) was developed and verified against cycle-by-cycle simulation. The proposed model is compatible with SPICE and other modern electronic circuit simulators and can be used to run DC (static transfer function), AC (small signal, frequency domain) and TRAN (large signal, time domain) analyses. The model is developed in terms of the average, large signal behavior while the small signal (AC) response is worked out automatically by the simulator. An extension to current programmed SEPIC for the case of peak current mode (PCM) control is also presented. This paper treats the case of SEPIC with uncoupled inductors.

Patent
21 May 1996

Patent
Arun Ramachandran1
02 Aug 1996
TL;DR: The use of the Verilog™ model eliminates the need to calculate short-circuit current at a SPICE circuit level as discussed by the authors and allows software to more readily process short circuit data.
Abstract: Short-circuit current and power consumption for an integrated circuit may be calculated by measuring short-circuit current for various cells within an integrated circuit using a Verilog™ logic level model of the cell. Each cell within an integrated circuit may be characterized by its inputs and outputs and connectivity. A corresponding SPICE sub-circuit model having the same logic characteristics as the cell may be generated. A number of calculation passes are made for each sub-circuit within a cell to determine short circuit current for each sub-circuit at various signal rise and fall times and for various inputs and outputs. Current data may be stored in a format compatible with Verilog™ propagation delay data. Overall power consumption and short circuit current for an integrated circuit may then be calculated from Verilog™ logic model data. The use of the Verilog™ model eliminates the need to calculate short circuit current at a SPICE circuit level. Moreover, putting short circuit data into a propagation delay format allows software to more readily process short circuit data.


Proceedings ArticleDOI
12 Aug 1996
TL;DR: In this paper, an accurate model for the evaluation of the CMOS short-circuit power dissipation for short-channel devices, on the basis of a CMOS inverter, is presented.
Abstract: This paper presents an accurate model for the evaluation of the CMOS short-circuit power dissipation for short-channel devices, on the basis of a CMOS inverter. The improvement of the proposed approach against previous works is due to the new derived, accurate, analytical expressions for the inverter output waveform which include for the first time the influences of both transistor currents, and the gate-to-drain coupling capacitance. The results produced by she suggested model show good agreement with SPICE simulations.

Journal ArticleDOI
TL;DR: In this article, an HEMT model was proposed for SPICE, which combines linear, saturation, and subthreshold modes with a single smooth description, and features high order continuity for accurate prediction of current-voltage characteristics, gain, and distortion.
Abstract: An HEMT model, suitable for SPICE, combines the linear, saturation, and subthreshold modes with a single smooth description. The new model features high order continuity for accurate prediction of current-voltage characteristics, gain, and distortion. This is demonstrated by comparison with measurement.