J
Jun Fan
Researcher at Missouri University of Science and Technology
Publications - 505
Citations - 7033
Jun Fan is an academic researcher from Missouri University of Science and Technology. The author has contributed to research in topics: Printed circuit board & Equivalent circuit. The author has an hindex of 36, co-authored 482 publications receiving 5641 citations. Previous affiliations of Jun Fan include Ulsan National Institute of Science and Technology & University of Missouri.
Papers
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Journal ArticleDOI
Impact of Frequency-Dependent and Nonlinear Parameters on Transient Analysis of Through Silicon Vias Equivalent Circuit
TL;DR: In this paper, an equivalent circuit model for through silicon vias including the nonlinear effect of metaloxide-semiconductor capacitance is introduced, which is combined to the frequency-dependent via resistance and inductance, as well as capacitance and conductance of the silicon substrate for a transient analysis.
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A Transfer Function Based Calculation Method for Radio Frequency Interference
TL;DR: In this paper, a transfer function based calculation method is proposed to estimate radio frequency interference (RFI) problems, which can clearly decompose the RFI problem into two parts: the noise source and the coupling transfer function to the antenna.
Journal ArticleDOI
Modeling of Coaxial Cable Bragg Grating by Coupled Mode Theory
TL;DR: In this paper, a coupled-mode-theory-based approach is applied for the first time to model the recently developed coaxial cable Bragg grating (CCBG).
Proceedings ArticleDOI
Investigation of mixed-mode input impedance of multi-layer differential vias for impedance matching with traces
TL;DR: In this article, the mixed-mode input impedance of differential vias in typical multilayer structures is derived, and the input impedance concept is used to achieve impedance matching at the via and trace connections.
Journal ArticleDOI
Near-field scanning for EM emission characterization
TL;DR: In this paper, the authors present a few important issues when using the near-field scanning technique for EM emission characterization, including calibration of field probes to eliminate or reduce the errors in the measurement of EM field components.