S
Samuel Graham
Researcher at Georgia Institute of Technology
Publications - 361
Citations - 12423
Samuel Graham is an academic researcher from Georgia Institute of Technology. The author has contributed to research in topics: Thermal conductivity & Thin film. The author has an hindex of 48, co-authored 347 publications receiving 9774 citations. Previous affiliations of Samuel Graham include Merck & Co. & United States Military Academy.
Papers
More filters
Proceedings ArticleDOI
Computational Investigation of Nanoscale Memristor Devices for Neuromorphic Computing
Darshan G. Pahinkar,Pradip Basnet,Bill Zivasatienraj,Alex S. Weidenbach,Matthew P. West,W. Alan Doolittle,Eric M. Vogel,Samuel Graham +7 more
TL;DR: This work focuses on the computational investigation of local and temporal variation of voltage, current and temperature, so that the coupled nature of heat transfer and current flow through these devices is analyzed and the effects of substrate materials, set/reset voltages on relative on-state/off-state resistances, current magnitude and filament temperature are determined.
Proceedings ArticleDOI
Steady state and transient thermal characterization of vertical GaN PIN diodes
Proceedings ArticleDOI
Thermal and mechanical characterization and calibration of heated microcantilevers
Journal ArticleDOI
Thermoreflectance Imaging of (Ultra)wide Band-Gap Devices with MoS2 Enhancement Coatings.
Riley Hanus,Sonal V. Rangnekar,Shahab Mollah,Kamal Hussain,Nicholas J. Hines,Eric R. Heller,Mark C. Hersam,Asif Khan,Samuel Graham +8 more
TL;DR: In this paper, an MoS2 coating is used as a thermal enhancement coating for measuring the surface temperature of (ultra)wide band-gap materials, which can be used to measure the peak operational temperature in the context of accelerated stress testing.
Posted Content
Thermal boundary conductance across epitaxial ZnO/GaN interfaces: Assessment of phonon gas models and atomistic Green's function approaches for predicting interfacial phonon transport
John T. Gaskins,George N. Kotsonis,Ashutosh Giri,Christopher T. Shelton,Edward Sachet,Zhe Cheng,Brian M. Foley,Zeyu Liu,Shenghong Ju,Junichiro,Mark S. Goorsky,Samuel Graham,Tengfei Luo,Asegun Henry,Jon Paul Maria,Patrick E. Hopkins +15 more
TL;DR: In this article, the authors present experimental measurements of the thermal boundary conductance (TBC) from $77 - 500$ K across isolated heteroepitaxially grown ZnO films on GaN substrates.