S
Samuel Graham
Researcher at Georgia Institute of Technology
Publications - 361
Citations - 12423
Samuel Graham is an academic researcher from Georgia Institute of Technology. The author has contributed to research in topics: Thermal conductivity & Thin film. The author has an hindex of 48, co-authored 347 publications receiving 9774 citations. Previous affiliations of Samuel Graham include Merck & Co. & United States Military Academy.
Papers
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Journal ArticleDOI
Scalable Modeling of Transient Self-Heating of GaN High-Electron-Mobility Transistors Based on Experimental Measurements
Adrien Cutivet,Georges Pavlidis,Bilal Hassan,Meriem Bouchilaoun,Christophe Rodriguez,Ali Soltani,Samuel Graham,Francois Boone,Hassan Maher +8 more
TL;DR: In this paper, an extraction procedure to fully model the transient self-heating of transistors from a GaN HEMT technology is described. But the authors focus on the thermal impedance of the transistors.
Proceedings ArticleDOI
System and process learning in a full-field, high-power EUVL alpha tool
W. P. Ballard,Daniel A. Tichenor,Donna J. O'Connell,Luis J. Bernardez,R. Lafon,Richard J. Anderson,Alvin H. Leung,Kenneth A. Williams,Steven J. Haney,Yon E. Perras,Karen L. Jefferson,Therese L. Porter,Daniel L. Knight,Pamela K. Barr,James L. Van De Vreugde,Richard H. Campiotti,Mark D. Zimmerman,Terry A. Johnson,Leonard E. Klebanoff,Philip A. Grunow,Samuel Graham,Dean A. Buchenauer,William C. Replogle,Tony G. Smith,John B. Wronosky,Joel R. Darnold,Kenneth L. Blaedel,Henry N. Chapman,J. Taylor,Layton C. Hale,G. E. Sommargren,E. M. Gullikson,Patrick P. Naulleau,Kenneth A. Goldberg,Sang Hun Lee,Harry Shields,Randall J. St. Pierre,Samuel Ponti +37 more
TL;DR: In this paper, a developmental projection optic box (POB) was successfully demonstrated in the alpha tool Engineering Test Stand (ETS) for full-field imaging with a POB 1.
Journal ArticleDOI
Influence of Polymer Substrate Damage on the Time Dependent Cracking of SiNx Barrier Films.
TL;DR: The present experiments over longer periods reveal a regime where cracking also develops in the polymer substrate, and a guideline to effectively improving the long-term reliability of flexible barriers by a substrate possessing high strength which limits substrate damage.
Book ChapterDOI
Temperature Measurement of Microdevices using Thermoreflectance and Raman Thermometry
Thomas E. Beechem,Samuel Graham +1 more
TL;DR: In this paper, the authors provide a summary in the physical basis, experimental methodology, and application of Raman thermometry and thermoreflectance with respect to the analysis of microdevices.
Journal ArticleDOI
Significantly Reduced Thermal Conductivity in Beta-(Al0.1Ga0.9)2O3/Ga2O3 Superlattices
Zhe Cheng,Nicholas Tanen,Celesta S. Chang,Jingjing Shi,Jonathan McCandless,David A. Muller,Debdeep Jena,Huili Grace Xing,Samuel Graham +8 more
TL;DR: In this paper, the authors measured the thermal conductivity of two-dimensional electron gas (2DEG) 2O3/Ga2O3 superlattices from 80 K to 480 K.