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Journal ArticleDOI

SRAM design on 65-nm CMOS technology with dynamic sleep transistor for leakage reduction

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TLDR
In this paper, a 70-Mb SRAM was designed and fabricated on a 65-nm CMOS technology, which features a 0.57-/spl mu/m/sup 2/6T SRAM cell with large noise margin down to 0.7 V for low-voltage operation.
Abstract: 
A 70-Mb SRAM is designed and fabricated on a 65-nm CMOS technology. It features a 0.57-/spl mu/m/sup 2/ 6T SRAM cell with large noise margin down to 0.7 V for low-voltage operation. The fully synchronized subarray contains an integrated leakage reduction scheme with dynamically controlled sleep transistor. SRAM virtual ground in standby is controlled by programmable bias transistors to achieve good voltage control with fine granularity under process skew. It also has a built-in programmable defect "screen" circuit for high volume manufacturing. The measurements showed that the SRAM leakage can be reduced by 3-5/spl times/ while maintaining the integrity of stored data.

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Citations
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Proceedings ArticleDOI

Monolayer transition metal dichalcogenide and black phosphorus transistors for low power robust SRAM design

TL;DR: Simulations show that at low operating voltages, TMDCFET and BPFET SRAMs exhibit significant advantages in static power, dynamic read/ write noise margin, and read/write delay over both nominal and read-write-assisted 16nm CMOSSRAMs.
Proceedings ArticleDOI

Novel SRAM bias control circuits for a low power L1 data cache

TL;DR: This paper proposes two novel bias control circuits to manage the power consumption of inactive cache cells in data retention mode and demonstrates the effectiveness of the proposed circuits to reduce the energy consumption of dvSRAM L1 data cache.
Proceedings ArticleDOI

Power, Energy and SNM Optimization of 6TSRAM Cell Using Power Gating Technique

TL;DR: Results show the significant increase in power and energy with improved static noise margin (SNM) as compared to non power gated conventional 6TSRAM cell.
Proceedings ArticleDOI

Using power gating techniques in area-array SoC floorplan design

TL;DR: This work decides which modules have chance to save power by sleep transistors insertion, and reserves enough area for them during floorplanning, and shows that this approach works well and can obtain lower power floorplans with supply noise aware sleep transistor insertion in area-array architecture.
Journal ArticleDOI

Monolayer Transistor SRAMs: Toward Low-Power, Denser Memory Systems

TL;DR: The authors' simulations show that at low operating voltages, TMDCFET/BPFET SRAMs exhibit significant advantages in static power, dynamic read/write noise margin, and read/ write delay over nominal 16nm CMOSSRAMs at both bitcell and array-level implementations.
References
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Proceedings ArticleDOI

Characterization of multi-bit soft error events in advanced SRAMs

TL;DR: An exhaustive characterization of multi-bit errors in 90/130 nm SRAMs is presented to support bit interleaving rules that make the impact of multi -bit errors negligible.
Journal ArticleDOI

A single-V/sub t/ low-leakage gated-ground cache for deep submicron

TL;DR: A novel integrated circuit and architectural level technique to reduce leakage power consumption in high-performance cache memories using single V/sub t/ (transistor threshold voltage) process and Experimental results on gated-ground caches show that data is retained (DRG-Cache) even if the memory is put in the standby mode of operation.
Journal ArticleDOI

A 300-MHz 25-/spl mu/A/Mb-leakage on-chip SRAM module featuring process-variation immunity and low-leakage-active mode for mobile-phone application processor

TL;DR: In this paper, an on-chip 1-Mb SRAM suitable for embedding in the application processor used in mobile cellular phones was developed, which supports three operating modes - high-speed active mode, low-leakage low-speed activity mode, and standby mode - and uses a subdivisional power-line control (SPC) scheme.
Proceedings ArticleDOI

A pico-joule class, 1 GHz, 32 KByte/spl times/64 b DSP SRAM with self reverse bias

TL;DR: In this paper, a self reverse biasing scheme was proposed to address leakage due to quantum tunneling and thermal excitation in all cell transistors, with an area, performance and noise margin penalty of less than 3% each.
Proceedings ArticleDOI

Two orders of magnitude leakage power reduction of low voltage SRAMs by row-by-row dynamic V/sub dd/ control (RRDV) scheme

TL;DR: In this article, a novel SRAM scheme is proposed that can reduce the active leakage power by two orders of magnitude in the low voltage region of less than 1 V, the VTH, V/sub TH/, is lowered to less than 0.2 V and the leakage power of memory cells becomes a dominant issue.
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