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Journal ArticleDOI

SRAM design on 65-nm CMOS technology with dynamic sleep transistor for leakage reduction

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TLDR
In this paper, a 70-Mb SRAM was designed and fabricated on a 65-nm CMOS technology, which features a 0.57-/spl mu/m/sup 2/6T SRAM cell with large noise margin down to 0.7 V for low-voltage operation.
Abstract: 
A 70-Mb SRAM is designed and fabricated on a 65-nm CMOS technology. It features a 0.57-/spl mu/m/sup 2/ 6T SRAM cell with large noise margin down to 0.7 V for low-voltage operation. The fully synchronized subarray contains an integrated leakage reduction scheme with dynamically controlled sleep transistor. SRAM virtual ground in standby is controlled by programmable bias transistors to achieve good voltage control with fine granularity under process skew. It also has a built-in programmable defect "screen" circuit for high volume manufacturing. The measurements showed that the SRAM leakage can be reduced by 3-5/spl times/ while maintaining the integrity of stored data.

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Citations
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Journal ArticleDOI

Low-Power Dynamic Memory Word Line Decoding for Static Random Access Memories

TL;DR: A dynamic word line decoder which is fast, has reduced active and leakage power dissipation, and also enables faster race-free sense timing is presented.
Proceedings ArticleDOI

An Adaptive Sleep Transistor Biasing Scheme for Low Leakage SRAM

TL;DR: An SRAM leakage reduction technique, referred to as adaptive sleep transistor biasing, is proposed, which automatically fine-tunes the source voltage of individual memory blocks to their optimum level, so that maximum leakage savings can be expected while data is safely retained during standby mode.
Patent

Setting threshold voltages of cells in a memory block to reduce leakage in the memory block

TL;DR: In this article, a memory block includes one or more bit lines that each include two or more cells, and each cell in each bit line has a distance from a sense amplifier coupled to the bit line.
Proceedings ArticleDOI

Variations-tolerant 9T SRAM circuit with robust and low leakage SLEEP mode

TL;DR: An asymmetrically ground-gated nine-transistor (9T) MTCMOS SRAM circuit is proposed in this paper for providing a low-leakage SLEEP mode with data retention capability and the mean values of static noise margin and write voltage margin are enhanced.
Journal ArticleDOI

IMCA: An Efficient In-Memory Convolution Accelerator

TL;DR: In this article, an efficient in-memory convolution accelerator (IMCA) is proposed based on associative inmemory processing to alleviate computational complexity and memory access cost directly, where the convolution operations are directly performed inside the memory as in-place operations.
References
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Proceedings ArticleDOI

Characterization of multi-bit soft error events in advanced SRAMs

TL;DR: An exhaustive characterization of multi-bit errors in 90/130 nm SRAMs is presented to support bit interleaving rules that make the impact of multi -bit errors negligible.
Journal ArticleDOI

A single-V/sub t/ low-leakage gated-ground cache for deep submicron

TL;DR: A novel integrated circuit and architectural level technique to reduce leakage power consumption in high-performance cache memories using single V/sub t/ (transistor threshold voltage) process and Experimental results on gated-ground caches show that data is retained (DRG-Cache) even if the memory is put in the standby mode of operation.
Journal ArticleDOI

A 300-MHz 25-/spl mu/A/Mb-leakage on-chip SRAM module featuring process-variation immunity and low-leakage-active mode for mobile-phone application processor

TL;DR: In this paper, an on-chip 1-Mb SRAM suitable for embedding in the application processor used in mobile cellular phones was developed, which supports three operating modes - high-speed active mode, low-leakage low-speed activity mode, and standby mode - and uses a subdivisional power-line control (SPC) scheme.
Proceedings ArticleDOI

A pico-joule class, 1 GHz, 32 KByte/spl times/64 b DSP SRAM with self reverse bias

TL;DR: In this paper, a self reverse biasing scheme was proposed to address leakage due to quantum tunneling and thermal excitation in all cell transistors, with an area, performance and noise margin penalty of less than 3% each.
Proceedings ArticleDOI

Two orders of magnitude leakage power reduction of low voltage SRAMs by row-by-row dynamic V/sub dd/ control (RRDV) scheme

TL;DR: In this article, a novel SRAM scheme is proposed that can reduce the active leakage power by two orders of magnitude in the low voltage region of less than 1 V, the VTH, V/sub TH/, is lowered to less than 0.2 V and the leakage power of memory cells becomes a dominant issue.
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