Institution
Cadence Design Systems
Company•San Jose, California, United States•
About: Cadence Design Systems is a company organization based out in San Jose, California, United States. It is known for research contribution in the topics: Circuit design & Routing (electronic design automation). The organization has 3139 authors who have published 3745 publications receiving 66410 citations. The organization is also known as: Cadence Design Systems, Inc.
Topics: Circuit design, Routing (electronic design automation), Integrated circuit, Integrated circuit design, Physical design
Papers published on a yearly basis
Papers
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23 Jan 2007
TL;DR: Experimental results demonstrate the effectiveness of the proposed method and show PriTBR and its structure-preserving version, SP-PriTBR, are superior to existing passive TBR and Krylov-subspace based moment-matching methods.
Abstract: In this paper, we present a novel passive model order reduction (MOR) method via projection-based truncated balanced realization method, PriTBR, for large RLC interconnect circuits. Different from existing passive truncated balanced realization (TBR) methods where numerically expensive Lur'e or algebraic Riccati (ARE's) equations are solved, the new method performs balanced truncation on linear system in descriptor form by solving generalized Lyapunov equations. Passivity preservation is achieved by congruence transformation instead of simple truncations. For the first time, passive model order reduction is achieved by combining Lyapunov equation based TBR method with congruence transformation. Compared with existing passive TBR, the new technique has the same accuracy and is numerically reliable, less expensive. In addition to passivity-preserving, it can be easily extended to preserve structure information inherent to RLC circuits, like block structure, reciprocity and sparsity. PriTBR can be applied as a second MOR stage combined with Krylov-subspace methods to generate a nearly optimal reduced model from a large scale interconnect circuit while passivity, structure, and reciprocity are preserved at the same time. Experimental results demonstrate the effectiveness of the proposed method and show PriTBR and its structure-preserving version, SP-PriTBR, are superior to existing passive TBR and Krylov-subspace based moment-matching methods.
18 citations
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28 Dec 2007TL;DR: In this paper, a method for modeling power management in an integrated circuit (IC) includes specifying a circuit design and a power architecture for the IC, the power architecture including a plurality of power domains for specifying power levels in different portions of the IC.
Abstract: A method for modeling power management in an integrated circuit (IC) includes: specifying a circuit design and a power architecture for the IC, the power architecture including a plurality of power domains for specifying power levels in different portions of the IC; determining an emulation module for the IC by including one or more hardware elements for modeling the power architecture in the emulation module; and using the emulation module to simulate changing power levels in one or more power domains of the IC including a power shutoff in at least one power domain.
18 citations
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07 Oct 1996TL;DR: An algorithm for identifying and replacing redundant latches by combinational logic such that no environment of the design can detect the change and the new design preserves the steady state behavior as well as all initializing sequences of the old design.
Abstract: For circuits where there may be latches with no reset line, we show how to replace some of them with combinational logic. All previous work in sequential optimization by latch removal assumes a designated initial state. Without this assumption, the design can power up in any state and earlier techniques are not applicable. We present an algorithm for identifying and replacing redundant latches by combinational logic such that no environment of the design can detect the change. The new design preserves the steady state behavior as well as all initializing sequences of the old design. We report experimental results on benchmark circuits and demonstrate savings in area without adverse impact on delay.
18 citations
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07 Dec 2006TL;DR: In this article, an adaptive phase-locked loop (PLL) circuit produces an output signal having a frequency in reference to the frequency of a reference signal, and an adjustable shift circuit is provided to time-shift the feedback signal.
Abstract: An adaptive phase-locked loop (PLL) circuit produces an output signal having a frequency in reference to the frequency of a reference signal. The PLL circuit includes an oscillator configured to generate the output signal according to a frequency control signal, and a processing circuit configured to generate a feedback signal deriving from the output signal. An adjustable shift circuit is provided to time-shift the feedback signal. The PLL further includes a phase comparison circuit configured to generate a phase error signal indicating a phase error between the time-shifted feedback signal and the reference signal, and a control circuit configured to generate the frequency control signal based on the phase error signal. The adjustable shift circuit adjusts a time-shift amount to time-shift the feedback signal according to the phase error signal.
18 citations
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22 Nov 2015TL;DR: This paper describes how a previously developed 3D-DfT architecture and corresponding EDA tool flows are adapted to support at-speed interconnect testing, also in the presence of 'shore logic' outside the die's wrapper boundary register.
Abstract: Inter-die connections in 2.5D-and 3D-stacked ICs require at-speed testing as their dynamic performance is crucial to the performance of the stack as a whole. In order to test at mission-mode speed and benefit from the already existing clock distribution network, our at-speed test approach for inter-die connections targets the entire register-to-register path that includes the interconnect. This forces the launching and capturing wrapper cells to be shared with functional flip-flops. In some designs, this unavoidably leads to some 'shore logic': a, typically small, amount of combinational logic outside the die's wrapper boundary register. This paper describes how we have adapted a previously developed 3D-DfT architecture and corresponding EDA tool flows to support at-speed interconnect testing, also in the presence of such 'shore logic'. The adaptations affect the DfT insertion of wrapper cells, the boundary model extraction, and the interconnect test pattern generation.
18 citations
Authors
Showing all 3142 results
Name | H-index | Papers | Citations |
---|---|---|---|
Alberto Sangiovanni-Vincentelli | 99 | 934 | 45201 |
Derong Liu | 77 | 608 | 19399 |
Andrew B. Kahng | 76 | 618 | 24097 |
Jason Cong | 76 | 594 | 24773 |
Kenneth L. McMillan | 60 | 150 | 20835 |
Edoardo Charbon | 60 | 526 | 12293 |
Richard B. Fair | 59 | 205 | 14653 |
John P. Hayes | 58 | 302 | 11206 |
Sachin S. Sapatnekar | 56 | 424 | 12543 |
Wayne G. Paprosky | 56 | 196 | 10571 |
Robert G. Meyer | 49 | 116 | 13011 |
Scott M. Sporer | 49 | 150 | 8085 |
Charles J. Alpert | 49 | 224 | 8287 |
Joao Marques-Silva | 48 | 289 | 9374 |
Paulo Flores | 48 | 321 | 7617 |