Institution
Cadence Design Systems
Company•San Jose, California, United States•
About: Cadence Design Systems is a company organization based out in San Jose, California, United States. It is known for research contribution in the topics: Circuit design & Routing (electronic design automation). The organization has 3139 authors who have published 3745 publications receiving 66410 citations. The organization is also known as: Cadence Design Systems, Inc.
Topics: Circuit design, Routing (electronic design automation), Integrated circuit, Integrated circuit design, Physical design
Papers published on a yearly basis
Papers
More filters
••
22 Oct 2006TL;DR: A new protocol is proposed which generalizes the previous schemes and is not only semantics-preserving but also memory-optimal in two senses: first, in terms of the number of buffers required to preserve semantics in the worst case and at any time, assuming no knowledge of future arrivals.
Abstract: Recently, we have proposed a set of buffering schemes to preserve the semantics of a synchronous program when the latter is implemented as a set of multiple tasks running under preemptive scheduling. These schemes, however, are not optimal in terms of memory (buffer usage). In this paper we propose a new protocol which generalizes the previous schemes. The new protocol is not only semantics-preserving but also memory-optimal in two senses: first, in terms of the number of buffers required to preserve semantics in the worst case (i.e.,for the "worst" possible arrival/execution pattern of the tasks); second, in terms of the number of buffers required to preserve semantics for any arrival/execution pattern and at any time, assuming no knowledge of future arrivals.
51 citations
••
TL;DR: The most critical components of a ‘holistic’ DTCO flow for an advanced technology node are reviewed and the differences between 7nm technology node definitions implemented with extreme ultraviolet and 193nm immersion lithography are quantified.
Abstract: This paper reviews the most critical components of a ‘holistic’ DTCO flow for an advanced technology node and in doing so quantifies the differences between 7nm technology node definitions implemented with extreme ultraviolet and 193nm immersion lithography. The DTCO topics covered include: setting scaling targets for critical pitches, gear-ratios, and cell height; defining a set of patterning solutions, required RET restrictions, and resulting patterning cost; compiling physical design objectives to achieve power, performance, and area scaling; developing a set of standard cell logic cell architectures; and finally assessing achievable cell-level as well as macro-level scaling.
51 citations
••
01 Apr 1998TL;DR: This paper presents an approach extending the sequence-pair approach for rectangular block placement to arbitrarily sized and shaped rectilinear blocks, and shows that the algorithm achieves results with excellent area utilization.
Abstract: With the recent advent of deep sub-micron technology and new packaging schemes such as Multi-Chip Modules(MCMs), integrated circuit components are often not rectangular. Most existing block placement approaches, however, only deal with rectangular blocks, resulting in inefficient area utilization. New approaches which can handle arbitrarily shaped blocks are essential to achieve high performance design. In this paper, we present an approach extending the sequence-pair approach for rectangular block placement to arbitrarily sized and shaped rectilinear blocks. Experimental results show that our algorithm achieves results with excellent area utilization.
51 citations
•
06 Oct 1998TL;DR: In this paper, a method and apparatus for managing simulation results involve identifying errors within a group of simulation results so that the errors can be recorded into a database and viewed for analysis.
Abstract: A method and apparatus for managing simulation results involve identifying errors within a group of simulation results so that the errors can be recorded into a database and viewed for analysis. In a preferred embodiment of the invention, distinct transactions within a group of simulation results are identified and recorded along with the identified errors. Recorded error-specific data and transaction-specific data are then utilized to graphically display the simulation results such that individual transactions identified within the simulation results are graphically distinct and such that errors occurring during a transaction are visually identified with the transaction. Recording and displaying error information and raising the level of abstraction of simulation results from cycles and signals to transactions enables easier simulation analysis and debugging.
51 citations
••
20 Oct 2010TL;DR: In this article, a combined formulation of counterexample-based abstraction (CBA) and proof based abstraction (PBA) for bit-level verification is presented, which is formulated as a single, incremental SAT-problem, interleaving CBA and PBA.
Abstract: This paper presents an efficient, combined formulation of two widely used abstraction methods for bit-level verification: counterexample-based abstraction (CBA) and proof-based abstraction (PBA). Unlike previous work, this new method is formulated as a single, incremental SAT-problem, interleaving CBA and PBA to develop the abstraction in a bottom-up fashion. It is argued that the new method is simpler conceptually and implementation-wise than previous approaches. As an added bonus, proof-logging is not required for the PBA part, which allows for a wider set of SAT-solvers to be used.
51 citations
Authors
Showing all 3142 results
Name | H-index | Papers | Citations |
---|---|---|---|
Alberto Sangiovanni-Vincentelli | 99 | 934 | 45201 |
Derong Liu | 77 | 608 | 19399 |
Andrew B. Kahng | 76 | 618 | 24097 |
Jason Cong | 76 | 594 | 24773 |
Kenneth L. McMillan | 60 | 150 | 20835 |
Edoardo Charbon | 60 | 526 | 12293 |
Richard B. Fair | 59 | 205 | 14653 |
John P. Hayes | 58 | 302 | 11206 |
Sachin S. Sapatnekar | 56 | 424 | 12543 |
Wayne G. Paprosky | 56 | 196 | 10571 |
Robert G. Meyer | 49 | 116 | 13011 |
Scott M. Sporer | 49 | 150 | 8085 |
Charles J. Alpert | 49 | 224 | 8287 |
Joao Marques-Silva | 48 | 289 | 9374 |
Paulo Flores | 48 | 321 | 7617 |