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Institution

Cadence Design Systems

CompanySan Jose, California, United States
About: Cadence Design Systems is a company organization based out in San Jose, California, United States. It is known for research contribution in the topics: Circuit design & Routing (electronic design automation). The organization has 3139 authors who have published 3745 publications receiving 66410 citations. The organization is also known as: Cadence Design Systems, Inc.


Papers
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Proceedings ArticleDOI
10 Jun 2002
TL;DR: This paper considers a particular subclass of asynchronous circuits (Null Convention Logic or NCL) and suggests a design flow that is based entirely on commercial CAD tools and shows a significant area improvement over known flows based on NCL.
Abstract: The roadblock to wide acceptance of asynchronous methodology is poor CAD support. Current asynchronous design tools require a significant re-education of designers, and their features are far behind synchronous commercial tools. This paper considers a particular subclass of asynchronous circuits (null convention logic or NCL) and suggests a design flow that is based entirely on commercial CAD tools. This new design flow shows a significant area improvement over known flows based on NCL.

38 citations

Patent
12 Jun 1995
TL;DR: In this article, a data structure that completely and accurately models a system of discrete function elements is presented, and a discrete function simulator is used to simulate the system using the data structure.
Abstract: A system and method increases discrete function simulator performance by creating a data structure that completely and accurately models a system of discrete function elements. A discrete function simulator simulates the system using the data structure. Sequential circuits are converted into blocks of combinational elements having latch variables stored to and read from memory. The simulator performance is dependent upon the number of system inputs and outputs and not on the number of discrete function elements in the circuit being simulated.

38 citations

Patent
18 Oct 2002
TL;DR: In this article, the authors proposed a method for eliminating routing congestion in an integrated circuit (IC) layout defined by a placement plan indicating a position within the layout of each cell forming the IC and routing plan, followed by nets interconnecting the cells.
Abstract: The invention relates to a method for eliminating routing congestion (81) in an integrated circuit (IC) layout defined by a placement plan (72, 75) indicating a position within the layout of each cell forming the IC and routing plan (73, 77, 79) describing routes followed by nets interconnecting the cells. Routing congestion is eliminated by estimating routing congestion in various areas of the layout and relocating each cell to least routing congested areas of the layout (83) for which cell relocation results in a reduction in the total lengths of the nets connected to the cell that exceeds a predetermined minimum reduction.

38 citations

Journal ArticleDOI
Bernard Aubert1, Marcella Bona1, Y. Karyotakis1, J. P. Lees1  +553 moreInstitutions (80)
TL;DR: In this article, a Dalitz-plot analysis of the hadronic decays of neutral B mesons to K{sup {+-}}{pi}{sup {-+}}{PI}{sup 0}.
Abstract: The authors report a Dalitz-plot analysis of the charmless hadronic decays of neutral B mesons to K{sup {+-}}{pi}{sup {-+}}{pi}{sup 0}. With a sample of (231.8 {+-} 2.6) x 10{sup 6}{Upsilon}(4S) {yields} B{bar B} decays collected by the BABAR detector at the PEP-II asymmetric-energy B Factory at SLAC, they measure the magnitudes and phases of the intermediate resonant and nonresonant amplitudes for B{sup 0} and {bar B}{sup 0} decays and determine the corresponding CP-averaged branching fractions and charge asymmetries. The inclusive branching fraction and CP-violating charge asymmetry are measured to be {Beta}(B{sup 0} {yields} K{sup +}{pi}{sup -}{pi}{sup 0}) = (35.7{sub -1.5}{sup +2.6} {+-} 2.2) x 10{sup -6}, and {Alpha}{sub CP} = -0.030{sub -0.051}{sup +0.045} {+-} 0.055 where the first errors are statistical and the second systematic. They observe the decay B{sup 0} {yields} K*{sup 0}(892){pi}{sup 0} with the branching fraction {Beta}(B{sup 0} {yields} K*{sup 0}(892){pi}{sup 0}) = (3.6{sub -0.8}{sup +0.7} {+-} 0.4) x 10{sup -6}. This measurement differs from zero by 5.6 standard deviations (including the systematic uncertainties). The selected sample also contains B{sup 0} {yields} {bar D}{sup 0}{pi}{sup 0} decays where {bar D}{sup 0} {yields} K{sup +}{pi}{sup -}, and they measure {Beta}(B{sup 0} {yields} {bar D}{sup 0}{pi}{sup 0}) = (2.93 {+-} 0.17 {+-} 0.18) x 10{sup -4}.

38 citations

Proceedings ArticleDOI
07 Nov 1999
TL;DR: The presented probabilistic state space search complements incomplete verification methods which are specialized in finding errors in large designs and implements a smooth trade-off between accuracy and computing effort.
Abstract: This paper describes a probabilistic approach to state space search. The presented method applies a ranking of the design states according to their probability of reaching a given target state based on a random walk model. This ranking can be used to prioritize an explicit or partial symbolic state exploration to find a trajectory from a set of initial states to a set of target states. A symbolic technique for estimating the reachability probability is described which implements a smooth trade-off between accuracy and computing effort. The presented probabilistic state space search complements incomplete verification methods which are specialized in finding errors in large designs.

38 citations


Authors

Showing all 3142 results

NameH-indexPapersCitations
Alberto Sangiovanni-Vincentelli9993445201
Derong Liu7760819399
Andrew B. Kahng7661824097
Jason Cong7659424773
Kenneth L. McMillan6015020835
Edoardo Charbon6052612293
Richard B. Fair5920514653
John P. Hayes5830211206
Sachin S. Sapatnekar5642412543
Wayne G. Paprosky5619610571
Robert G. Meyer4911613011
Scott M. Sporer491508085
Charles J. Alpert492248287
Joao Marques-Silva482899374
Paulo Flores483217617
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Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
20223
2021103
2020185
2019212
2018103
201788