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Robert M. Wallace

Researcher at University of Texas at Dallas

Publications -  503
Citations -  41237

Robert M. Wallace is an academic researcher from University of Texas at Dallas. The author has contributed to research in topics: X-ray photoelectron spectroscopy & Atomic layer deposition. The author has an hindex of 84, co-authored 499 publications receiving 37236 citations. Previous affiliations of Robert M. Wallace include Texas Instruments & University of Texas System.

Papers
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In situ TEM characterization of shear-stress-induced interlayer sliding in the cross section view of molybdenum disulfide.

TL;DR: In this paper, a method to manipulate, tear, and slide free-standing atomic layers of molybdenum disulfide was demonstrated by electrostatically coupling it to an oxidized tungsten probe attached to a micromanipulator at a bias above ±7 V.
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In-Situ Studies of Interfacial Bonding of High-k Dielectrics for CMOS Beyond 22nm

TL;DR: In this article, the reaction of Hf-germanate on Ge and alumina on InGaAs was studied using in-situ synthesis and surface analysis, which enables the study of the bond formation at these interfaces and enables a better understanding of the reaction mechanisms.
Patent

PFPE coatings for micro-mechanical devices

TL;DR: In this article, a micro-mechanical device includes relatively movable elements which contact or engage and which thereafter stick or adhere to a perfluoropolyether (PFPE) film applied to the contacting or engaging portions of the elements.
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X-ray photoelectron spectroscopy study of electrodeposited nanostructured CeO2 films

TL;DR: In this article, the crystal structure and oxidation state of nanostructured CeO2 films are studied by x-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS), respectively.
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Copper-metal deposition on self assembled monolayer for making top contacts in molecular electronic devices.

TL;DR: This work shows that carboxyl-terminated alkyl monolayers can be prepared with the same high density and quality as those achieved for less versatile methyl-terminate alkyL monolayer, as evidenced by electrical properties that are not dominated by interface defects.