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Journal ArticleDOI

Monte Carlo simulation of electron transport in the III-nitride wurtzite phase materials system: binaries and ternaries

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TLDR
In this paper, a comprehensive study of the transport dynamics of electrons in the ternary compounds, Al/sub x/Ga/sub 1-x/N and In/sub ng/g/ng/s/n g/n/g n/g 1.x/n, is presented, which includes all of the major scattering mechanisms.
Abstract
We present a comprehensive study of the transport dynamics of electrons in the ternary compounds, Al/sub x/Ga/sub 1-x/N and In/sub x/Ga/sub 1-x/N. Calculations are made using a nonparabolic effective mass energy band model. Monte Carlo simulation that includes all of the major scattering mechanisms. The band parameters used in the simulation are extracted from optimized pseudopotential band calculations to ensure excellent agreement with experimental information and ab initio band models. The effects of alloy scattering on the electron transport physics are examined. The steady state velocity field curves and low field mobilities are calculated for representative compositions of these alloys at different temperatures and ionized impurity concentrations. A field dependent mobility model is provided for both ternary compounds AlGaN and InGaN. The parameters for the low and high field mobility models for these ternary compounds are extracted and presented. The mobility models can be employed in simulations of devices that incorporate the ternary III-nitrides.

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Citations
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Proceedings ArticleDOI

Influence of properties of Si 3 N 4 passivation layer on the electrical characteristics of Normally-off AlGaN/GaN HEMT

TL;DR: In this article, a comparison between two samples with two different SiN passivation layers was performed, and an increment of the drain leakage current increasing the Si concentration in the SiN layer was observed.
Journal ArticleDOI

The investigation of mole fraction dependence of mobility for InxGa1-xN alloy

TL;DR: In this article, the Boltzmann transport equation involved in relevant scattering mechanisms has been solved and the mobility of In x Ga 1− x N alloy by the iterative method interval x = 0 - 1 in low field.
Proceedings ArticleDOI

Extending the bounds of performance in E-mode p-channel GaN MOSHFETs

TL;DR: In this article, the authors investigated the distribution of the electric field within a normally-off p-channel heterostructure field effect transistor in GaN, and showed that a high |V th | requires a reduction of the thickness of oxide and the GaN channel layer.
Journal ArticleDOI

A semi empirical approach for submicron GaN MESFET using an accurate velocity field relationship for high power applications

TL;DR: The model has been extended to predict the microwave parameters such as transconductance and output conductance of the device and is compared with the experimental results to validate the model and to present the influence of electron drift velocity modeling on the device parameters.
Journal ArticleDOI

Negative small-signal impedance of nanoscale GaN diodes in the terahertz frequency regime

TL;DR: In this paper, a physical mechanism of electrical instability in the terahertz frequency range is explored in a nanoscale two-terminal configuration of nitride-based structures under a high-field transport regime.
References
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Journal ArticleDOI

GaN, AlN, and InN: A review

TL;DR: The status of research on both wurtzite and zinc-blende GaN, AlN, and InN and their alloys including exciting recent results is reviewed in this paper.
Journal ArticleDOI

Gan : processing, defects, and devices

TL;DR: The role of extended and point defects, and key impurities such as C, O, and H, on the electrical and optical properties of GaN is reviewed in this article, along with the influence of process-induced or grown-in defects and impurities on the device physics.
Journal ArticleDOI

Ionicity of the Chemical Bond in Crystals

TL;DR: The role of quantum-mechanical sum rules and spectral moments in constructing simplified models of bond and band behavior is explored in this article, where a wide range of physical properties including crystal structure, energy bands, elastic constants, ionization energies, and impurity states are discussed.
Journal ArticleDOI

Semiconductor ultraviolet detectors

TL;DR: In this paper, a comprehensive analysis of the developments in ultraviolet (UV) detector technology is described and the current state of the art of different types of semiconductor UV detectors is presented.
Journal ArticleDOI

Comparison of 6H-SiC, 3C-SiC, and Si for power devices

TL;DR: In this paper, the drift region properties of 6H- and 3C-SiC-based Schottky rectifiers and power MOSFETs that result in breakdown voltages from 50 to 5000 V are defined.
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