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Monte Carlo simulation of electron transport in the III-nitride wurtzite phase materials system: binaries and ternaries

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TLDR
In this paper, a comprehensive study of the transport dynamics of electrons in the ternary compounds, Al/sub x/Ga/sub 1-x/N and In/sub ng/g/ng/s/n g/n/g n/g 1.x/n, is presented, which includes all of the major scattering mechanisms.
Abstract
We present a comprehensive study of the transport dynamics of electrons in the ternary compounds, Al/sub x/Ga/sub 1-x/N and In/sub x/Ga/sub 1-x/N. Calculations are made using a nonparabolic effective mass energy band model. Monte Carlo simulation that includes all of the major scattering mechanisms. The band parameters used in the simulation are extracted from optimized pseudopotential band calculations to ensure excellent agreement with experimental information and ab initio band models. The effects of alloy scattering on the electron transport physics are examined. The steady state velocity field curves and low field mobilities are calculated for representative compositions of these alloys at different temperatures and ionized impurity concentrations. A field dependent mobility model is provided for both ternary compounds AlGaN and InGaN. The parameters for the low and high field mobility models for these ternary compounds are extracted and presented. The mobility models can be employed in simulations of devices that incorporate the ternary III-nitrides.

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Citations
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Patent

Improving hole mobility in electronic devices

TL;DR: In this paper, a hole-transporting (p-type) material consisting of a III-V semiconductor having a wurtzite crystal structure was proposed, where the semiconductor (i) was under tensile strain in the plane perpendicular to the [0001] direction, (ii) is under uniaxial compressive strain along the [0002] direction and (iii) has an enhanced internal parameter u.
Journal ArticleDOI

Comparison of hot electron transport properties in wurtzite phase of ZnS, GaN and 6H-SiC

TL;DR: In this paper, an ensemble Monte Carlo simulation has been carried out to study temperature and doping dependencies of electron drift velocity in ZnS, GaN and 6H-SiC.
Proceedings ArticleDOI

Determination of the influence of device structure and alloy material on the noise behavior of hetero-FETs

TL;DR: In this article, the noise performance of sub-quarter micrometer gate length FETs is determined by using physical simulators, and the relation between the terminal noise currents and the internally generated noise at the different device regions are determined.
Proceedings ArticleDOI

DC, AC and Breakdown Simulation of the Gallium Nitride High Electron Mobility Transistor with a Few-Layer Graphene Heat-Removal System

TL;DR: In this article , the effect of the distance between the gate and the graphene heat-removal element on the device behavior was analyzed, and it was shown that extending the graphene layers towards the gate does not influence the DC characteristics but enhances greatly the AC performance.
Journal ArticleDOI

Effect of the temperature and doping on electron transport in AlxGa1?xN alloy by monte carlo method

TL;DR: In this article, the behavior of electrons in an AlxGa1-xN alloy was simulated using Monte Carlo simulations, using the most simulation method appropriate for this type of calculation: the method of Monte Carlo.
References
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Journal ArticleDOI

GaN, AlN, and InN: A review

TL;DR: The status of research on both wurtzite and zinc-blende GaN, AlN, and InN and their alloys including exciting recent results is reviewed in this paper.
Journal ArticleDOI

Gan : processing, defects, and devices

TL;DR: The role of extended and point defects, and key impurities such as C, O, and H, on the electrical and optical properties of GaN is reviewed in this article, along with the influence of process-induced or grown-in defects and impurities on the device physics.
Journal ArticleDOI

Ionicity of the Chemical Bond in Crystals

TL;DR: The role of quantum-mechanical sum rules and spectral moments in constructing simplified models of bond and band behavior is explored in this article, where a wide range of physical properties including crystal structure, energy bands, elastic constants, ionization energies, and impurity states are discussed.
Journal ArticleDOI

Semiconductor ultraviolet detectors

TL;DR: In this paper, a comprehensive analysis of the developments in ultraviolet (UV) detector technology is described and the current state of the art of different types of semiconductor UV detectors is presented.
Journal ArticleDOI

Comparison of 6H-SiC, 3C-SiC, and Si for power devices

TL;DR: In this paper, the drift region properties of 6H- and 3C-SiC-based Schottky rectifiers and power MOSFETs that result in breakdown voltages from 50 to 5000 V are defined.
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