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Monte Carlo simulation of electron transport in the III-nitride wurtzite phase materials system: binaries and ternaries

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TLDR
In this paper, a comprehensive study of the transport dynamics of electrons in the ternary compounds, Al/sub x/Ga/sub 1-x/N and In/sub ng/g/ng/s/n g/n/g n/g 1.x/n, is presented, which includes all of the major scattering mechanisms.
Abstract
We present a comprehensive study of the transport dynamics of electrons in the ternary compounds, Al/sub x/Ga/sub 1-x/N and In/sub x/Ga/sub 1-x/N. Calculations are made using a nonparabolic effective mass energy band model. Monte Carlo simulation that includes all of the major scattering mechanisms. The band parameters used in the simulation are extracted from optimized pseudopotential band calculations to ensure excellent agreement with experimental information and ab initio band models. The effects of alloy scattering on the electron transport physics are examined. The steady state velocity field curves and low field mobilities are calculated for representative compositions of these alloys at different temperatures and ionized impurity concentrations. A field dependent mobility model is provided for both ternary compounds AlGaN and InGaN. The parameters for the low and high field mobility models for these ternary compounds are extracted and presented. The mobility models can be employed in simulations of devices that incorporate the ternary III-nitrides.

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Citations
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Valence band splittings and band offsets of AlN, GaN and InN.

Su-Huai Wei, +1 more
TL;DR: In this article, first principles electronic structure calculations on wurtzite AlN, GaN, and InN reveal crystal field splitting parameters ΔCF of −217, 42, and 41 meV, respectively.
Journal ArticleDOI

Review—Ionizing Radiation Damage Effects on GaN Devices

TL;DR: In this article, the radiation resistance of GaN-based blue light emitting diodes (LEDs) to different types of ionizing radiation, and the role of existing defects in GaN are discussed.
Journal ArticleDOI

Trapping Effects in the Transient Response of AlGaN/GaN HEMT Devices

TL;DR: In this paper, the transient analysis of an AlGaN/GaN high-electron mobility transistor (HEMT) device is presented, revealing clear mechanisms of current collapse and related dispersion effects.
Journal ArticleDOI

Current injection efficiency induced efficiency-droop in InGaN quantum well light-emitting diodes

TL;DR: In this paper, a self-consistent 6-band k ǫ p method is used to calculate the band structure for InGaN single quantum well (QW) based light-emitting diodes (LEDs).
Journal ArticleDOI

First-principles calculations of charge carrier mobility and conductivity in bulk semiconductors and two-dimensional materials

TL;DR: This article reviews the most recent developments in the area of ab initio calculations of carrier mobilities of semiconductors and discusses the extension of the methodology to study spintronics and topological materials and the possibility of incorporating Berry-phase effects and many-body correlations beyond the standard Boltzmann formalism.
References
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Journal ArticleDOI

Electron transport in wurtzite indium nitride

TL;DR: In this paper, the velocity field characteristics of wurtzite indium nitride were determined using an ensemble Monte Carlo approach, and it was found that indium oxide exhibits an extremely high peak drift velocity at room temperature, 4.3×107 cm/s, at a doping concentration of 1.0×1017 cm−3.
Journal ArticleDOI

Valence band splittings and band offsets of AlN, GaN, and InN

TL;DR: In this paper, first principles electronic structure calculations on wurtzite AlN, GaN, and InN reveal crystal field splitting parameters ΔCF of −217, 42, and 41 meV, respectively.

Valence band splittings and band offsets of AlN, GaN and InN.

Su-Huai Wei, +1 more
TL;DR: In this article, first principles electronic structure calculations on wurtzite AlN, GaN, and InN reveal crystal field splitting parameters ΔCF of −217, 42, and 41 meV, respectively.
Journal ArticleDOI

Progress in silicon carbide semiconductor electronics technology

TL;DR: In this article, the authors present the present status of SiC-based semiconductor electronics and identify areas where technological maturation is needed and the prospects for resolving these obstacles are discussed.
Journal ArticleDOI

Temperature activated conductance in GaN/AlGaN heterostructure field effect transistors operating at temperatures up to 300 °C

TL;DR: In this paper, the dc characteristics and microwave performance of AlGaN/GaN heterostructure field effect transistors in the temperature range from 25 to 300°C were investigated.
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