S
Samit K. Ray
Researcher at Indian Institute of Technology Kharagpur
Publications - 542
Citations - 9698
Samit K. Ray is an academic researcher from Indian Institute of Technology Kharagpur. The author has contributed to research in topics: Photoluminescence & Thin film. The author has an hindex of 44, co-authored 507 publications receiving 8085 citations. Previous affiliations of Samit K. Ray include University of Delaware & Indian Institute of Technology Kanpur.
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The Emission of Terahertz Radiation from Doped Silicon Devices
TL;DR: In this paper, a new type of terahertz (THz) emitting device with higher powers (above 0.1 milliWatt) based on radiative impurity transitions in doped silicon wafers was proposed.
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Characteristics of UHVCVD grown Si/Si1−x−yGexCy/Si quantum well heterostructure
TL;DR: In this article, the effect of addition of C on strain and vibrational characteristics of Si 1−x Ge x (y=0) layer has been studied, and the results of the carrier confinement characteristics, device transconductance and optical transitions in a Si/SiGeC/Si quantum well are presented.
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Piezo‐Phototronic Effect‐Induced Self‐Powered Broadband Photodetectors using Environmentally Stable α ‐CsPbI 3 Perovskite Nanocrystals
TL;DR: In this paper , the vertical heterojunction of cesium lead iodide (CsPbI3) nanocrystals (NCs) and zinc oxide (ZnO) films on a flexible platform was used for self-powered broadband photodetectors.
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Vacancy-Mediated Anomalous Emission Characteristics of Size-Confined Semiconducting CoTe2.
Shreyasi Das,Sourabh Pal,Partha Kumbhakar,Raphael M. Tromer,Solomon Demiss Negedu,Douglas S. Galvao,Soumendra Kumar Das,Chandra Sekhar Tiwary,Samit K. Ray +8 more
TL;DR: In this paper , the optical properties of the quantum-confined semiconducting phase of cobalt ditelluride (CoTe2) for the first time, exhibiting excellent two-color band photoabsorption attributes covering the UV-visible and near-infrared regions.
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Schottky Barrier Height of Ti on Strained Layer Si/Si1–xGex Films
TL;DR: The Schottky barrier height of Ti on p-type Si1-xGex/Si and Si and Si have been investigated in the temperature range 110-250 K using the current voltage technique as mentioned in this paper.