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Samit K. Ray

Researcher at Indian Institute of Technology Kharagpur

Publications -  542
Citations -  9698

Samit K. Ray is an academic researcher from Indian Institute of Technology Kharagpur. The author has contributed to research in topics: Photoluminescence & Thin film. The author has an hindex of 44, co-authored 507 publications receiving 8085 citations. Previous affiliations of Samit K. Ray include University of Delaware & Indian Institute of Technology Kanpur.

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The bonding configuration in a partially relaxed pseudomorphic epilayer of SiGe: evidence of the BC-8 phase of silicon

TL;DR: In this paper, the bonding configuration of a silicon host lattice in a carbon-induced partially relaxed pseudomorphic epilayer of SiGe is studied using x-ray photoelectron spectroscopy, high-resolution XRD and Raman spectroscopic techniques.
Proceedings ArticleDOI

Effect of annealing on photoluminescence property of nano particle composite ZnO films

TL;DR: The effect of annealing temperature on the structural and photoluminescence properties of nanocrystalline ZnO films deposited by sol-gel process has been investigated in this paper.
Proceedings ArticleDOI

Broadband absorption in Au nanoparticle-decorated chlorophyll b for biophotonic applications

TL;DR: In this article, a broadband absorption of gold nanoparticle-decorated chlorophyll b was extracted from spinach, and a broad absorption spectrum ranging from 315 nm to 1025 nm was obtained.
Journal ArticleDOI

Excitation power-independent photoluminescence of inverted quantum hut structures embedded in SiGe superlattice

TL;DR: In this paper, the photoluminescence of MBE-grown SiGe superlattice structures having inverted quantum huts of Ge formed below Ge-on-Si interfaces was studied.
Journal Article

Synthesis and characterization of nickel titanium melt-spun ribbon for micro-actuator device application

TL;DR: In this paper, the phase transformation of the ribbons has been studied using resistivity measurement as a function of temperature, and the structure, composition and surface topography of melt-spun ribbons are studied using scanning electron microscopy, energy dispersive X-ray measurements and atomic force microscopy.