North Carolina State University

About: North Carolina State University is a education organization based out in Raleigh, North Carolina, United States. It is known for research contribution in the topics: Population & Thin film. The organization has 44161 authors who have published 101744 publications receiving 3456774 citations. The organization is also known as: NCSU & North Carolina State University at Raleigh.

Service-oriented computing

Abstract: Traditional approaches to software development - the ones embodied in CASE tools and modeling frameworks - are appropriate for building individual software components, but they are not designed to face the challenges of open environments. Service-oriented computing provides a way to create a new architecture that reflects components' trends toward autonomy and heterogeneity. We thus emphasize SOC concepts instead of how to deploy Web services in accord with current standards. To begin the series, we describe the key concepts and abstractions of SOC and the elements of a corresponding engineering methodology.

Power and sensitivity of alternative fit indices in tests of measurement invariance.

Abstract: Confirmatory factor analytic tests of measurement invariance (MI) based on the chi-square statistic are known to be highly sensitive to sample size. For this reason, G. W. Cheung and R. B. Rensvold (2002) recommended using alternative fit indices (AFIs) in MI investigations. In this article, the authors investigated the performance of AFIs with simulated data known to not be invariant. The results indicate that AFIs are much less sensitive to sample size and are more sensitive to a lack of invariance than chi-square-based tests of MI. The authors suggest reporting differences in comparative fit index (CFI) and R. P. McDonald's (1989) noncentrality index (NCI) to evaluate whether MI exists. Although a general value of change in CFI (.002) seemed to perform well in the analyses, condition specific change in McDonald's NCI values exhibited better performance than a single change in McDonald's NCI value. Tables of these values are provided as are recommendations for best practices in MI testing.

Alternative dielectrics to silicon dioxide for memory and logic devices

Abstract: The silicon-based microelectronics industry is rapidly approaching a point where device fabrication can no longer be simply scaled to progressively smaller sizes. Technological decisions must now be made that will substantially alter the directions along which silicon devices continue to develop. One such challenge is the need for higher permittivity dielectrics to replace silicon dioxide, the properties of which have hitherto been instrumental to the industry's success. Considerable efforts have already been made to develop replacement dielectrics for dynamic random-access memories. These developments serve to illustrate the magnitude of the now urgent problem of identifying alternatives to silicon dioxide for the gate dielectric in logic devices, such as the ubiquitous field-effect transistor.