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Journal ArticleDOI

Lateral and Vertical Transistors Using the AlGaN/GaN Heterostructure

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TLDR
In this paper, the development, performance, and status of lateral and vertical GaN devices are discussed, and the current and voltage demand for high power conversion application makes the chip area in a lateral topology so large that it becomes more difficult to manufacture.
Abstract
Power conversion losses are endemic in all areas of electricity consumption, including motion control, lighting, air conditioning, and information technology. Si, the workhorse of the industry, has reached its material limits. Increasingly, the lateral AlGaN/GaN HEMT based on gallium nitride (GaN-on-Si) is becoming the device of choice for medium power electronics as it enables high-power conversion efficiency and reduced form factor at attractive pricing for wide market penetration. The reduced form factor enabled by high-efficiency operation at high frequency further enables significant system price reduction because of savings in bulky extensive passive elements and heat sink costs. The high-power market, however, still remains unaddressed by lateral GaN devices. The current and voltage demand for high power conversion application makes the chip area in a lateral topology so large that it becomes more difficult to manufacture. Vertical GaN devices would play a big role alongside of silicon carbide (SiC) to address the high power conversion needs. In this paper, the development, performance, and status of lateral and vertical GaN devices are discussed.

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Citations
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Journal ArticleDOI

Insulated gate and surface passivation structures for GaN-based power transistors

TL;DR: In this paper, the authors describe critical issues and problems including leakage current, current collapse and threshold voltage instability in high-electron-mobility transistors (HEMTs) using oxides, nitrides and high-κ dielectrics.
Journal ArticleDOI

GaN-on-Si Vertical Schottky and p-n Diodes

TL;DR: In this article, the authors demonstrated GaN vertical Schottky and p-n diodes on Si substrates for the first time, achieving a breakdown voltage of 205 V and a soft BV higher than 300 V, respectively, with peak electric field of 2.9 MV/cm in GaN.
Journal ArticleDOI

Origin and Control of OFF-State Leakage Current in GaN-on-Si Vertical Diodes

TL;DR: In this article, an advanced edge termination technology has been developed by combining plasma treatment, tetramethylammonium hydroxide wet etching, and ion implantation to suppress the leakage along the etch sidewall.
Journal ArticleDOI

Performance and Reliability Review of 650 V and 900 V Silicon and SiC Devices: MOSFETs, Cascode JFETs and IGBTs

TL;DR: The future of power conversion at low-to-medium voltages (around 650 V) poses a very interesting debate with all the major device manufacturers releasing different technology variants ranging from SiC Trench MOSFETs, SiC Planar MOSFs, cascode-driven WBG Fets, silicon NPT and Field-stop IGBTs, silicon super-junction MOSfETs and enhancement mode GaN high electron mobility transistors (HEMTs).
Journal ArticleDOI

The dawn of Ga2O3 HEMTs for high power electronics - A review

TL;DR: In this article, a perspective of Ga2O3 material towards making high electron mobility transistors (HEMTs) for a certain class of RF applications is given, where various defects in WBG devices and their effects on the reliability aspects are also addressed.
References
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Journal ArticleDOI

Gate Injection Transistor (GIT)—A Normally-Off AlGaN/GaN Power Transistor Using Conductivity Modulation

TL;DR: In this paper, a gate injection transistor (GIT) was proposed to increase the electron density in the channel, resulting in a dramatic increase of the drain current owing to the conductivity modulation.
Journal ArticleDOI

High-performance enhancement-mode AlGaN/GaN HEMTs using fluoride-based plasma treatment

TL;DR: In this paper, a novel approach was proposed to fabricate high-performance enhancement mode (E-mode) AlGaN/GaN HEMTs based on fluoride-based plasma treatment of the gate region.
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High Breakdown Voltage Achieved on AlGaN/GaN HEMTs With Integrated Slant Field Plates

TL;DR: In this article, a self-aligned "slant-field-plate" technology is presented as an improvement over the discrete multiple field plates for high breakdown voltage AlGaN/GaN HEMTs.
Journal ArticleDOI

Semiconductors for high‐voltage, vertical channel field‐effect transistors

TL;DR: In this paper, the influence of material parameters on the characteristics of vertical channel power field effect transistors is examined, and it is demonstrated that for devices with the same breakdown voltage and device structure, the onresistance is inversely proportional to the third power of the energyband gap and inversely proportion to the mobility.
Journal ArticleDOI

1200-V Normally Off GaN-on-Si Field-Effect Transistors With Low Dynamic on -Resistance

TL;DR: In this paper, high-voltage GaN field-effect transistors fabricated on Si substrates were reported to have high breakdown voltage of 1200 V and low dynamic on-resistance at highvoltage operation.
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