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Journal ArticleDOI

High performance tunnel field-effect transistor by gate and source engineering.

TLDR
A new nanodevice technology based on TFET concepts, a multi-finger-gate TFET with a dopant-segregated Schottky source (mFSB-TFET) is proposed and experimentally demonstrated, indicating its dominant quantum BTBT mechanism for switching.
Abstract
As one of the most promising candidates for future nanoelectronic devices, tunnel field-effect transistors (TFET) can overcome the subthreshold slope (SS) limitation of MOSFET, whereas high ON-current, low OFF-current and steep switching can hardly be obtained at the same time for experimental TFETs. In this paper, we developed a new nanodevice technology based on TFET concepts. By designing the gate configuration and introducing the optimized Schottky junction, a multi-finger-gate TFET with a dopant-segregated Schottky source (mFSB-TFET) is proposed and experimentally demonstrated. A steeper SS can be achieved in the fabricated mFSB-TFET on the bulk Si substrate benefiting from the coupled quantum band-to-band tunneling (BTBT) mechanism, as well as a high ION/IOFF ratio (~107) at VDS = 0.2 V without an area penalty. By compatible SOI CMOS technology, the fabricated Si mFSB-TFET device was further optimized with a high ION/IOFF ratio of ~108 and a steeper SS of over 5.5 decades of current. A minimum SS of below 60 mV dec−1 was experimentally obtained, indicating its dominant quantum BTBT mechanism for switching.

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Citations
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Journal ArticleDOI

Demonstration of L-Shaped Tunnel Field-Effect Transistors

TL;DR: In this article, an L-shaped tunnel FET (TFET), which features band-to-band tunneling (BTBT) perpendicular to the channel direction, is experimentally demonstrated for the first time.
Journal ArticleDOI

Analytical model of drain current of cylindrical surrounding gate p-n-i-n TFET

TL;DR: In this paper, an analytical model on the current-voltage characteristics of cylindrical surrounding gate p-n-i-n tunnel field effect transistor (TFET) is developed.
Journal ArticleDOI

A Novel Dopingless Fin-Shaped SiGe Channel TFET with Improved Performance.

TL;DR: By using the dopingless channel and fin structure, the difficulties of doping process and asymmetric gate overlap formation can be resolved and the structure of DF-TFET can possess good manufacture applicability and remarkably reduce footprint.
Journal ArticleDOI

Investigation on the Effects of Gate-Source Overlap/Underlap and Source Doping Gradient of n -Type Si Cylindrical Gate-All-Around Tunnel Field-Effect Transistors

TL;DR: In this article, the effects of the gate-source overlap/underlap and the source doping gradient (SDG) of the n -type Si cylindrical gate-all-around (GAA) TFET by the TCAD tools were comprehensively examined.
Journal ArticleDOI

First Principles Study of the Ambipolarity in a Germanene Nanoribbon Tunneling Field Effect Transistor

TL;DR: In this article, the effects of hetero-dielectric gate material and gate-drain underlap on the ambipolar and ON-state current of a germanene nanoribbon (GeNR) tunneling field effect transistors (TFETs) are examined.
References
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Journal ArticleDOI

Tunnel field-effect transistors as energy-efficient electronic switches

TL;DR: Tunnels based on ultrathin semiconducting films or nanowires could achieve a 100-fold power reduction over complementary metal–oxide–semiconductor transistors, so integrating tunnel FETs with CMOS technology could improve low-power integrated circuits.
Journal ArticleDOI

Low-Voltage Tunnel Transistors for Beyond CMOS Logic

TL;DR: This review introduces and summarizes progress in the development of the tunnel field- effect transistors (TFETs) including its origin, current experimental and theoretical performance relative to the metal-oxide-semiconductor field-effect transistor (MOSFET), basic current-transport theory, design tradeoffs, and fundamental challenges.
Proceedings ArticleDOI

Fabrication, characterization, and physics of III–V heterojunction tunneling Field Effect Transistors (H-TFET) for steep sub-threshold swing

TL;DR: In this paper, the steepest sub-threshold swing (SS < 60mV/decade) was achieved in a III-V TFET by using thin gate oxide, heterojunction engineering and high source doping.
Journal ArticleDOI

Field-effect transistors based on two-dimensional materials for logic applications

TL;DR: In this paper, field effect transistors for logic applications, based on two representative two-dimensional (2D) materials, graphene and MoS2, are discussed, and the future developments in 2D material transistors are discussed.
Proceedings ArticleDOI

Impact of SOI, Si 1-x Ge x OI and GeOI substrates on CMOS compatible Tunnel FET performance

TL;DR: In this article, the Drift Tunnel FET (DTFET) was proposed to solve the TFET bipolar parasitic conduction by a novel TFET architecture, with improved OFF state control, and demonstrated functional TFET and CMOS devices on Si1-xGexOI (x=15-30-100%) co-integrated with the same SOI process flow.
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