Proceedings ArticleDOI
Physical unclonable functions for device authentication and secret key generation
G. Edward Suh,Srinivas Devadas +1 more
- pp 9-14
TLDR
This work presents PUF designs that exploit inherent delay characteristics of wires and transistors that differ from chip to chip, and describes how PUFs can enable low-cost authentication of individual ICs and generate volatile secret keys for cryptographic operations.Abstract:
Physical Unclonable Functions (PUFs) are innovative circuit primitives that extract secrets from physical characteristics of integrated circuits (ICs). We present PUF designs that exploit inherent delay characteristics of wires and transistors that differ from chip to chip, and describe how PUFs can enable low-cost authentication of individual ICs and generate volatile secret keys for cryptographic operations.read more
Citations
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Journal ArticleDOI
A survey on physical authentication methods for smart objects in IoT ecosystem
Sai Jiao,Ren Ping Liu +1 more
TL;DR: The recent advancement in physical authentication of smart electronic objects is summarized, and a new group of RFID concept that enables unique physic authentication of agricultural products using advanced material technology derived from semiconductor industry is discussed.
Journal ArticleDOI
Organic Current Mirror PUF for Improved Stability Against Device Aging
TL;DR: An organic current mirror PUF (OCM-PUF) that can be fabricated on a flexible substrate that adapts a current mirror structure to achieve self-compensation of the device performance degradation of OTFTs, which is unavoidable in most organic materials.
Lightweight Cryptography for Passive RFID Tags
TL;DR: A comprehensive engineering to lightweight cryptography is presented, a classification is proposed and its various ramifications are explored by giving key examples in each of them and a stream cipher is proposed that is among the smallest in the published literature and aims at being implemented on printed electronics RFID tags.
Proceedings ArticleDOI
CMOS image sensor based physical unclonable function for smart phone security applications
TL;DR: Simulations on a typical 3-T CMOS image sensor in GF 65nm CMOS technology show that the proposed PUF can generate robust and reliable challenge-response pairs with an uniqueness of 50.12% and a reliability of 100% at temperature varying from 0°C to 100°C and supply voltage variation.
Journal ArticleDOI
A Dynamically Configurable PUF and Dynamic Matching Authentication Protocol
TL;DR: In this paper, a dynamic configurable physical unclonable function (PUF) structure is proposed to address the issue of strong PUF designs are vulnerable to machine learning (ML) based modeling attacks.
References
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Journal ArticleDOI
Physical one-way functions
TL;DR: The concept of fabrication complexity is introduced as a way of quantifying the difficulty of materially cloning physical systems with arbitrary internal states as primitives for physical analogs of cryptosystems.
Proceedings ArticleDOI
Silicon physical random functions
TL;DR: It is argued that a complex integrated circuit can be viewed as a silicon PUF and a technique to identify and authenticate individual integrated circuits (ICs) is described.
Tamper resistance: a cautionary note
Ross Anderson,Markus G. Kuhn +1 more
TL;DR: It is concluded that trusting tamper resistance is problematic; smartcards are broken routinely, and even a device that was described by a government signals agency as 'the most secure processor generally available' turns out to be vulnerable.
Journal ArticleDOI
Extracting secret keys from integrated circuits
TL;DR: It is shown that arbiter-based PUFs are realizable and well suited to build key-cards that need to be resistant to physical attacks and to be identified securely and reliably over a practical range of environmental variations such as temperature and power supply voltage.
Journal ArticleDOI
Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration
TL;DR: In this paper, a model describing the maximum clock frequency distribution of a microprocessor is derived and compared with wafer sort data for a recent 0.25-/spl mu/m microprocessor.