Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films.
Nobumichi Tamura,Alastair A. MacDowell,Ralph Spolenak,B. C. Valek,John C. Bravman,W. L. Brown,Richard Celestre,Howard A. Padmore,B. W. Batterman,J. R. Patel +9 more
TLDR
Scanning X-ray microdiffraction (microSXRD) combines the use of high-brilliance synchrotron sources with the latest achromaticX-ray focusing optics and fast large-area two-dimensional-detector technology to study thin aluminium and copper blanket films and lines following electromigration testing and/or thermal cycling experiments.Abstract:
Scanning X-ray microdiffraction (µSXRD) combines the use of high-brilliance synchrotron sources with the latest achromatic X-ray focusing optics and fast large-area two-dimensional-detector technology. Using white beams or a combination of white and monochromatic beams, this technique allows for the orientation and strain/stress mapping of polycrystalline thin films with submicrometer spatial resolution. The technique is described in detail as applied to the study of thin aluminium and copper blanket films and lines following electromigration testing and/or thermal cycling experiments. It is shown that there are significant orientation and strain/stress variations between grains and inside individual grains. A polycrystalline film when investigated at the granular (micrometer) level shows a highly mechanically inhomogeneous medium that allows insight into its mesoscopic properties. If the µSXRD data are averaged over a macroscopic range, results show good agreement with direct macroscopic texture and stress measurements.read more
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At the limit of polychromatic microdiffraction
Gene E. Ice,J.W.L. Pang,Bennett C. Larson,John D. Budai,Jonathan Zachary Tischler,Jae-Young Choi,Wenjun Liu,Chian Liu,Lahsen Assoufid,Deming Shu,Ali M. Khounsary +10 more
TL;DR: In this paper, the authors describe ongoing efforts to improve the spatial, temporal and momentum transfer resolution of polychromatic microdiffraction on beamline 34-ID-E at the Advanced Photon Source (APS).
Distribution and Burgers vectors of dislocations insemiconductor wafers investigated by rocking-curve imaging
D. Lübbert,Claudio Ferrari,Petr Mikulík,Petra Pernot,Lukas Helfen,Nicola Verdi,D. Korytár,Tilo Baumbach +7 more
TL;DR: In this paper, an extension of the RCI method is proposed by which the dislocation densities in largescale samples (semiconductor wafer crystals) can be quantified and their variation across the sample surface determined in an instrumentally simple way.
Journal ArticleDOI
Influence of the U3O7 domain structure on cracking during the oxidation of UO2
Lionel Desgranges,Hervé Palancher,M. Gamaleri,Jean-Sébastien Micha,Virgil Optasanu,Laura Raceanu,Tony Montesin,Nicolas Creton +7 more
TL;DR: In this article, the authors present some μ-Laue X-ray diffraction results, which evidence that the U 3 O 7 layer, grown by topotaxy on UO 2, is made of domains with different crystalline orientations.
Journal Article
Mapping mesoscale heterogeneity in the plastic deformation of a copper single crystal
TL;DR: Morris et al. as discussed by the authors mapped mesoscale heterogeneity in the plastic deformation of a copper single crystal using a focused synchrotron radiation polychromatic beam with a resolution of 1-3 µm.
Journal ArticleDOI
Spatial distribution of crystalline corrosion products formed during corrosion of stainless steel in concrete
Marijana Serdar,Cagla Meral,Martin Kunz,Dubravka Bjegović,Hans-Rudolf Wenk,Paulo J.M. Monteiro +5 more
TL;DR: In this paper, the mineralogy and spatial distribution of nano-crystalline corrosion products that form in the steel/concrete interface were characterized using synchrotron X-ray micro-diffraction (μ-XRD).
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