Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films.
Nobumichi Tamura,Alastair A. MacDowell,Ralph Spolenak,B. C. Valek,John C. Bravman,W. L. Brown,Richard Celestre,Howard A. Padmore,B. W. Batterman,J. R. Patel +9 more
TLDR
Scanning X-ray microdiffraction (microSXRD) combines the use of high-brilliance synchrotron sources with the latest achromaticX-ray focusing optics and fast large-area two-dimensional-detector technology to study thin aluminium and copper blanket films and lines following electromigration testing and/or thermal cycling experiments.Abstract:
Scanning X-ray microdiffraction (µSXRD) combines the use of high-brilliance synchrotron sources with the latest achromatic X-ray focusing optics and fast large-area two-dimensional-detector technology. Using white beams or a combination of white and monochromatic beams, this technique allows for the orientation and strain/stress mapping of polycrystalline thin films with submicrometer spatial resolution. The technique is described in detail as applied to the study of thin aluminium and copper blanket films and lines following electromigration testing and/or thermal cycling experiments. It is shown that there are significant orientation and strain/stress variations between grains and inside individual grains. A polycrystalline film when investigated at the granular (micrometer) level shows a highly mechanically inhomogeneous medium that allows insight into its mesoscopic properties. If the µSXRD data are averaged over a macroscopic range, results show good agreement with direct macroscopic texture and stress measurements.read more
Citations
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Predicting thickness dependent twin boundary formation in sputtered Cu films
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High-energy transmission Laue micro-beam X-ray diffraction: a probe for intra-granular lattice orientation and elastic strain in thicker samples.
TL;DR: The development of high-energy transmission Laue (HETL) micro- beam X-ray diffraction is described, extending the micro-beam Laue technique to significantly higher photon energies (50-150 keV), which allows the probing of thicker sample sections, with the potential for grain-level characterization of real engineering components.
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Disruption of crystalline structure of Sn3.5Ag induced by electric current
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Low Stress Encapsulants? Influence of Encapsulation Materials on Stress and Fracture of Thin Silicon Solar Cells as Revealed by Synchrotron X-ray Submicron Diffraction☆
Karthic Narayanan Rengarajan,Ihor Radchenko,Gregoria Illya,Vincent Handara,Martin Kunz,Nobumichi Tamura,Arief Suriadi Budiman +6 more
TL;DR: In this article, the effect of two polymer encapsulations with different material properties such as Young's modulus (E), yield strength etc. on the residual stress of mono-crystalline silicon was studied through synchrotron X-ray microdiffraction.
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Can Laue microdiffraction be used to solve and refine complex inorganic structures
TL;DR: In this paper, the specificities of Laue diffraction are exploited to study randomly oriented stationary microcrystals of inorganic materials, and a series of simulations on four model structures for three experimental setups have been performed.
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