Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films.
Nobumichi Tamura,Alastair A. MacDowell,Ralph Spolenak,B. C. Valek,John C. Bravman,W. L. Brown,Richard Celestre,Howard A. Padmore,B. W. Batterman,J. R. Patel +9 more
TLDR
Scanning X-ray microdiffraction (microSXRD) combines the use of high-brilliance synchrotron sources with the latest achromaticX-ray focusing optics and fast large-area two-dimensional-detector technology to study thin aluminium and copper blanket films and lines following electromigration testing and/or thermal cycling experiments.Abstract:
Scanning X-ray microdiffraction (µSXRD) combines the use of high-brilliance synchrotron sources with the latest achromatic X-ray focusing optics and fast large-area two-dimensional-detector technology. Using white beams or a combination of white and monochromatic beams, this technique allows for the orientation and strain/stress mapping of polycrystalline thin films with submicrometer spatial resolution. The technique is described in detail as applied to the study of thin aluminium and copper blanket films and lines following electromigration testing and/or thermal cycling experiments. It is shown that there are significant orientation and strain/stress variations between grains and inside individual grains. A polycrystalline film when investigated at the granular (micrometer) level shows a highly mechanically inhomogeneous medium that allows insight into its mesoscopic properties. If the µSXRD data are averaged over a macroscopic range, results show good agreement with direct macroscopic texture and stress measurements.read more
Citations
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Probing intra-granular deformation by micro-beam Laue diffraction
TL;DR: In this article, micro-beam Laue diffraction is used to probe the interior of individual grains within a polycrystalline sample and the diffracted radiation forms a pattern of Laue spots which is captured by an area detector.
Posted Content
A tunable multi-color "rainbow" filter for improved stress and dislocation density field mapping in polycrystals using x-ray Laue microdiffraction
Odile Robach,Jean-Sébastien Micha,Olivier Ulrich,O. Geaymond,Olivier Sicardy,Jürgend Härtwig,François Rieutord +6 more
TL;DR: The `rainbow' method is presented, which allows measurement of the energy profiles of the Laue spots while remaining in the white-beam mode and its validation through the measurement of a known lattice parameter.
Journal ArticleDOI
Imaging of grain-level orientation and strain in thicker metallic polycrystals by high energy transmission micro-beam Laue (HETL) diffraction techniques
Felix Hofmann,Brian Abbey,L.D. Connor,Nikolaos Baimpas,Xu Song,Sinéad Keegan,Alexander M. Korsunsky +6 more
TL;DR: For high performance, safety-critical applications, such as aerospace components, in-depth understanding of the material's response to complex loading conditions is essential as discussed by the authors, which is essential for high performance and safety critical applications.
Journal ArticleDOI
Evidence for residual elastic strain in deformed natural quartz
TL;DR: In this paper, the authors measured residual elastic strain in naturally deformed, quartz-containing rocks with high spatial resolution using Laue microdiffraction with white synchrotron x-rays.
Journal ArticleDOI
Using a non-monochromatic microbeam for serial snapshot crystallography
Catherine Dejoie,Catherine Dejoie,Lynne B. McCusker,Christian Baerlocher,Rafael Abela,Bruce D. Patterson,Martin Kunz,Nobumichi Tamura +7 more
TL;DR: In this paper, a broad-band-pass diffraction method based on Laue single-crystal microdiffraction and the experimental setup on BL12.3.2 at the Advanced Light Source in Berkeley is presented.
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