Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films.
Nobumichi Tamura,Alastair A. MacDowell,Ralph Spolenak,B. C. Valek,John C. Bravman,W. L. Brown,Richard Celestre,Howard A. Padmore,B. W. Batterman,J. R. Patel +9 more
TLDR
Scanning X-ray microdiffraction (microSXRD) combines the use of high-brilliance synchrotron sources with the latest achromaticX-ray focusing optics and fast large-area two-dimensional-detector technology to study thin aluminium and copper blanket films and lines following electromigration testing and/or thermal cycling experiments.Abstract:
Scanning X-ray microdiffraction (µSXRD) combines the use of high-brilliance synchrotron sources with the latest achromatic X-ray focusing optics and fast large-area two-dimensional-detector technology. Using white beams or a combination of white and monochromatic beams, this technique allows for the orientation and strain/stress mapping of polycrystalline thin films with submicrometer spatial resolution. The technique is described in detail as applied to the study of thin aluminium and copper blanket films and lines following electromigration testing and/or thermal cycling experiments. It is shown that there are significant orientation and strain/stress variations between grains and inside individual grains. A polycrystalline film when investigated at the granular (micrometer) level shows a highly mechanically inhomogeneous medium that allows insight into its mesoscopic properties. If the µSXRD data are averaged over a macroscopic range, results show good agreement with direct macroscopic texture and stress measurements.read more
Citations
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Journal ArticleDOI
Indexing of diffraction patterns for determination of crystal orientations.
TL;DR: Besides a general description of available methods, concrete algorithms are presented in detail and their applicability to patterns of various types is demonstrated; a program based on these algorithms is shown to index Kikuchi patterns, Kossel patterns and Laue patterns, among others.
Dissertation
Etude des Inhomogénéités de Déformation dans les Films Minces Polycristallins par Diffraction X Cohérente
TL;DR: In this paper, the authors propose a methodologie based on the connaissance de la forme du grain to reconstruct a trois dimensions intra-grain with a resolution d'une vingtaine de nanometres dans les trois directions.
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High-Performance Parallel and Stream Processing of X-ray Microdiffraction Data on Multicores
TL;DR: This system provides a high-performance processing kernel to achieve near real-time data analysis of image data from synchrotron experiments and is able to be scaled up to operate on clusters of multi-cores for processing multiple images concurrently.
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In situ analysis of deformation twins within a magnesium polycrystal: (II) twin growth.
TL;DR: It is found that twin growth rates in the HCP material are not proportional to active twin's SF values, though the SF value is related to the magnitude of driving resource, and the maximum SF criterion for twin variant selection is invalid here.
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Spatiotemporal mapping of microscopic strains and defects to reveal Li-dendrite-induced failure in all-solid-state batteries
Hao Shen,Kai Chen,Jiawei Kou,Zhanhui Jia,Nobumichi Tamura,Weibo Hua,Wei-Qiang Tang,Helmut Ehrenberg,Marca M. Doeff +8 more
TL;DR: In this paper , the spatial distribution and temporal evolution of strains and defects in crystalline solid-state electrolytes at the micro-scale, and how this affects dendrite growth are studied.
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